Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
Centre for Energy Research, Hungarian Academy of Sciences ESEO-TRITEL Team
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, inrush current)
ESEO-TRITEL Team
MTA EK-SVL-2015-352-02-11A-00
Budapest, October, 2015
The material is the intellectual property of the Centre for Energy Research, Hungarian Academy of Sciences. Unauthorized use is not permitted. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
Project:
Title:
ESEO-TRITEL QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH CURRENT)
Authors:
ESEO-TRITEL Team / T-Network Kft.
Test Level:
Qualification
App. Model:
Engineering Qualification Model (EQM)
App. Test Procedure:
MTA EK-SVL-2015-352-01-09A-05
Type of the document:
MTA EK DOCUMENT
Registry number:
MTA EK-SVL-2015-352-02-11A-00
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Signatures Issue
0.
Date
15/10/2015
Authors
Reviewed by
Approved by
ESEO-TRITEL Team T-Network Kft.
Attila Hirn
Balázs Zábori
1. 2.
Revision Date
Short description of the revision
1. 2. 5.
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Distribution List Company Name SITAEL S.p.a. Nicola Melega SITAEL S.p.a. Alberto Corbelli SITAEL S.p.a. Alessandro Avanzi ESA Katarzyna Woroniak ESA Antonio de Luca ESA Jarek Tracz ESA Christian Bungeroth SITAEL S.p.a. archives European Space Agency (ESA) archives MTA EK archives
No. of copies 1 1 1 1 1 1 1 1 1 1
Document History Document ID MTA EK-SVL-2015-352-02-11A-00
Issue / Revision iss0 / rev0
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TABLE OF CONTENTS 1.
LIST OF ABBREVIATIONS.............................................................................................. 7
2.
Scope ................................................................................................................................... 8
3.
4.
5.
6.
2.1.
General......................................................................................................................... 8
2.2.
Objectives .................................................................................................................... 8
Applicable and reference documents ................................................................................ 13 3.1.
Applicable documents ............................................................................................... 13
3.2.
Reference documents ................................................................................................. 13
Participants required ......................................................................................................... 15 4.1.
General....................................................................................................................... 15
4.2.
Required personnel .................................................................................................... 15
Test article ......................................................................................................................... 16 5.1.
General qualification testing considerations.............................................................. 16
5.2.
General payload description ...................................................................................... 17
5.3.
ESEO-TRITEL payload electrical interface descriptions.......................................... 20
5.4.
ESEO-TRITEL switching frequencies ...................................................................... 22
5.5.
ESEO Harness definitions applicable for the EMC tests .......................................... 23
5.6.
ESEO-TRITEL LISN used ........................................................................................ 24
5.7.
General test configuration and measurement tolerances ........................................... 26
5.8.
The CE measurement descriptions ............................................................................ 27
5.9.
Inrush current measurement descriptions .................................................................. 31
5.10.
The CS measurement descriptions ......................................................................... 33
5.11.
CS Spike transient measurement description ......................................................... 38
Test conditions .................................................................................................................. 40 6.1.
General....................................................................................................................... 40
6.2.
Test tolerances and accuracies ................................................................................... 41
6.3.
Test program activities............................................................................................... 42
6.4.
Inspections ................................................................................................................. 42
6.5.
Quality Assurance ...................................................................................................... 42
6.6.
Documentation........................................................................................................... 42
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6.7.
Pictures ...................................................................................................................... 42
7.
Instrumentation and Test Equipment ................................................................................ 43
8.
Mode of operation ............................................................................................................. 47
9.
Step-by-step procedure ..................................................................................................... 48
10.
Accept/reject criteria ..................................................................................................... 73
11.
Test Report Sign-Off Sheet ........................................................................................... 74
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1. LIST OF ABBREVIATIONS AC APM CE CS EGSE EMC ESEO EQM EUT FM ISS IVA LET LMP N/A PC PIPS PS RF SAA SUP TBC TBD TBS TBW
Alternating Current Attached Pressurized Module Conducted Emission Conducted Susceptibility Electrical Ground Support Equipment Electromagnetic Compatibility European Student Earth Orbiter Engineering and Qualification Model Equipment Under Test Flight Model International Space Station Intra-vehicular Activity Linear Energy Transfer Langmuir Probe Not applicable Computer Passivated Implanted Planar Silicon Power Supply Radio Frequency South Atlantic Anomaly Standard Utility Panel To be confirmed To be determined To be specified To be written
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2. Scope 2.1. General This document describes the EMC Tests (CE, CS, inrush current) performed on the Engineering and Qualification Model (EQM) of the ESEO-TRITEL experiment in accordance with [AD 1]. This document contains the test plan, a detailed step by step procedure, the test execution description and the test results.
2.2. Objectives The purpose of the EMC Tests is to demonstrate that the ESEO-TRITEL hardware meets the following requirements: - INT-EIDB-6100 [AD 1], - ENV-EIDB-6140 [AD 1], - ENV-EIDB-6145 [AD 1], - ENV-EIDB-6150 [AD 1], - ENV-EIDB-6155 [AD 1], - ENV-EIDB-6160 [AD 1], - ENV-EIDB-6165 [AD 1].
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1. Table – Test requirement definitions
Req. ID INT-EIDB-6100
Requirement description TRITEL shall be designed so that correct operation will continue in the presence of RF emissions from the ESEO spacecraft. TRITEL shall have differential mode conducted emission limits defined as follows:
ENV-EIDB-6140
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Req. ID
Requirement description TRITEL shall have common mode conducted emission limits defined as follows:
ENV-EIDB-6145
All payloads shall have inrush current conducted emission limits defined as follows: ● Conducted current ripple and spikes on the primary power bus inputs of the unit, measured between positive and return lines (DM), shall be less than 40 mApp (TBC). ● Conducted voltage ripple/spikes on the primary power bus inputs of the unit, measured between positive and return lines, shall be less than 250 mVpp (ripple) and 500 mVpp (spikes) (TBC). ENV-EIDB-6150
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Req. ID
Requirement description TRITEL shall have the following differential mode conducted susceptibility limits:
ENV-EIDB-6155
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Req. ID
Requirement description TRITEL shall have the following common mode conducted susceptibility limits:
ENV-EIDB-6160
TRITEL shall have the following spike transient conducted susceptibility limits:
ENV-EIDB-6165
where the level 0 on Y axis represents the DC bus voltage and the maximum allowed spike is equal to ± 100% of the actual line voltage. Time is normalized to the duration of the transient. The pulse specification shall be the following: Between 1 and 10 µsec with an amplitude (in absolute value) double of the power bus voltage (+/- 50.4V).
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3. Applicable and reference documents 3.1. Applicable documents 2. Table – Applicable documents Document Title
Document No.
Issue
Language
[AD 1] TRITEL Experiment Interface Document
AS-12_0005-TRITELEIDB-01_v2.2
i7r2
English
[AD 2] ESEO-TRITEL Payload Test Plan
AS-12_0005-TRITEL-TP01_v2.2
i4r3
English
[AD 3] ECSS Space Engineering – Testing
ECSS-E-10-03C
[AD 4] ECSS Space Engineering –
ECSS-E-ST-20-07C
[AD 5] ESEO Harness Design Definition File
AS-12_0005-SYS-PLAHRN-AR-01
[AD 6] EMC Analysis Report
AS-12_0005-SYS-AR-03
[AD 7] EMC Control Plan
AS-12_0005-SYS-PL-07
[AD 8] Electromagnetic Compatibility Handbook
ECSS-E-HB-20-07A
EID-B
Document TP
Electromagnetic compatibility
ESEO-TRITEL T-Network Qualification
[AD 9] EMC Test Report
ANNEX I, iss1, rev1 EMC-151008/1
1 June 2012 7 Feb 2012 27 March 2015 27 March 2015 27 March 2015 5 Sep 2012 20 Oct 2015
Document No.
Issue
Language
i2r1
English
i2r1
English
i2r2
English
Radiat. Prot. Dosim., 120, 401–404, 2006
-
English
Radiat. Meas., 43, 427431, 2008
-
English
English English English
English
English English English
3.2. Reference documents 3. Table – Reference documents Document Title
[RD 1] TRITEL EMC QUALIFICATION TEST [RD 2] [RD 3] [RD 4]
[RD 5]
PROCEDURE AND TEST REPORT TRITEL EMC DELTA TEST PROCEDURE AND TEST REPORT TRITEL EMC ACCEPTANCE TEST PROCEDURE AND TEST REPORT Pázmándi, T., Deme, S., Láng, E., Space dosimetry with the application of a 3D silicon detector telescope: response function and inverse algorithm Hirn, A., Pázmándi, T., Deme, S., Apáthy, I., Bodnár, L., Csőke, A., TRITEL-S: Development of a complex dosimetry
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TRITEL-TEST-EMCQUAL_20111201_i2r1 TRITEL-TEST-EMCDELTA_20120601_i2r1 TRITEL-TEST-EMCACC_20120421_i2r2
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[RD 6] [RD 7] [RD 8]
Document Title instrument for a satellite in geostationary transfer orbit Hirn, A., Models of performances of dosimetric telescopes in the anisotropic radiation field in low Earth orbit Vette, J. I., The NASA/National Space Science Data Center Trapped Radiation Environment Model Program (1964-1991) Zábori, B., Hirn, A., Bencze, P., The relationship between plasma effects and cosmic radiation studied with TRITEL-LMP measurements during the ESEO mission
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Document No.
Issue
Language
Acta Astronaut., 66, 13681372, 2010
-
English
NSSDC/WDC-A-R&S 9129, 1991
-
English
J. Adv. Space Res., 48, pp. 240–253, 2011
-
English
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4. Participants required 4.1. General As the test is performed under the ESEO-TRITEL project responsibility, ESA project representatives are present during the course of the test program, as needed. The ESEO-TRITEL project representatives are responsible for the performance of test item related activities such as: Transportation to the test facility; Visual inspections; Electrical health checks, if any; Proper operation of the test facility; Supply and installation of the sensor equipment; Test results summary; Analysis of results.
4.2. Required personnel The following personnel shall be present as needed during the test program. The tests and inspections carried out by: Name ESEO-TRITEL students
Function
Organization
Test Conductors
Signature
MTA EK
Approved
supported by specialists required for specific tests: István Apáthy
Test Conductor/ Payload Developer
MTA EK
Approved
Sándor Tatár
Test Conductor/ T-Network specialist
T-Network
Approved
approved by the ESEO-ESEO-TRITEL project supervisor: Balázs Zábori
Project Supervisor
MTA EK
Approved
MTA EK
Approved
MTA EK
Approved
approved by the university coordinator: Attila Hirn
University Coordinator
and witnessed by P/A representative: Roland Horváth
Assurance Representative
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5. Test article 5.1. General qualification testing considerations Qualification testing shall be performed to provide evidence that the space segment element or equipment performs in accordance with its specifications in the intended environments with the specified qualification margins (ECSS-E-ST-10-03C 4.5.2a). Qualification shall be carried‐out on hardware and software which is representative of the end item configuration in terms of design, materials, tooling and methods (ECSS-E-ST-10-02C 5.2.4.2b). The ESEO-TRITEL payload is a space segment element (see ECSS-E-ST-10-03C 3.1.17 Figure 3-2). 5.1.1. Qualification test requirements When a full Qualification model is developed for a space segment elements qualification the test baseline shall consist of the tests specified in Table 6‐1 (ECSS-E-ST-10-03C 6.2a).
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5.2. General payload description The development of the TRITEL 3D silicon detector telescope began in the Hungarian Academy of Sciences Centre for Energy Research (MTA EK, the former Hungarian Academy of Sciences KFKI Atomic Energy Research Institute) several years ago. By evaluating the deposited energy spectra recorded by the instrument the absorbed dose, the linear energy transfer (LET) spectra in three directions, the average quality factor of the cosmic radiation and the dose equivalent can be determined for different segments of the orbit [RD 4]. TRITEL has three mutually orthogonal telescopes with altogether six identical fully depleted, passivated implanted planar silicon (PIPS) detectors (Figure 1). The silicon detectors with a thickness of 300 μm and a sensitive area of 220 mm2 are mounted in pairs at a distance of 8.9 mm, forming three orthogonal telescopes with an aperture of ≈120° both in the forward and backward directions and with a geometric factor of 5.1 cm2sr. The most important geometrical parameters of the TRITEL telescope are summarized in Table 4. 4. Table – The main geometrical parameters of the TRITEL 3D telescope
Parameter Radius of the detectors (r) Effective surface of the detectors Separation between the detectors in one telescope axis (p) Ratio of the separation between the detectors and the radius (q=p/r) Geometric factor G (for one telescope axis in 4π) Maximum angle of incidence (for one detector pair) Minimum path length in the detector (depletion layer thickness, w) Average path length in the detector (assuming an isotropic field) Maximum path length in the detector (for maximum angle of incidence) Ratio of the maximum and minimum path lengths
Value 8.4 mm 222 mm2 8.9 mm 1.06 5.1 cm2sr 62.1° 300 μm 361 μm 641 μm 2.14
With this geometry an almost uniform sensitivity is achieved in 4π solid angle. The combined sensitivity of the three telescopes is shown in Figure 1, where the spherical zones represent relative sensitivities of 0%, 0-20%, 20-40%, …, 80-100%. The sensitivity has maxima at the intersections of the great circles. The signal of only one of the two detectors in a telescope – the measuring detector – will be analyzed, while the other – the so called gating detector – will be used only by the coincidence circuit. The coincidence energy spectra produced by the analyzer are used to obtain the LET spectrum because of the path length limitation due to the telescope geometry. The evaluation software converts the LET spectrum to an average quality factor. The final output of the system will be the dose equivalent.
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The instrument cannot provide the primary energy spectrum but only measures the energy deposit (ΔE) of charged particles; protons, electrons and different ions are not discriminated either. The deposited energy spectra are generated every 10 minutes from the ΔE measurements, i.e. a significant fraction (about 1/9) of an orbit is required to obtain a spectrum. The lower level of discrimination in terms of deposited energy is 50 keV (relativistic protons) and the upper limit of the measurement range is around 80 MeV. The contribution of ions to energies higher than 80 MeV is recorded in the overflow channel. The recorded spectrum between 50 keV and 80 MeV is divided into 128 channels with quasi-logarithmic steps and it corresponds to a LET range of 0.2-120 keV/μm in water [RD 5].
1. Figure – The 3D telescope geometry: telescope axes (left), 3D view of the telescope block (middle) and combined sensitivity of the three telescopes (right). The spherical zones represent relative sensitivities of 0%, 0-20%, 20-40%, …, 80-100%; the sensitivity has maxima at the intersections of the great circles; r is the radius and p is the distance between the detectors
After evaluating the results of the measurements it might be possible to make an assessment of the anisotropies in the radiation field as well as the effects of the Earth shadow and the South Atlantic Anomaly (SAA) on the measured spectra [RD 6]. The contribution of the galactic cosmic rays, the solar cosmic rays and the particle flux of high energy particles precipitating from the radiation belts will also be analyzed and the results will be compared with the fluxes calculated with the standard AP-8 and AE-8 trapped proton and electron models [RD 7]. Simultaneous measurements carried out with the Langmuir Probe (LMP) and the TRITEL payload would make it possible to investigate the relationship between the plasma environment and cosmic rays at the altitude of the satellite, too [RD 8]. Operational ranges of the TRITEL telescopes in terms of fluxes and absorbed dose rates are shown in Table 5. The maximum flux was calculated from the maximum count rates that can be measured. When estimating the minimum flux, 10 counts per time spectrum channel were considered.
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5. Table – Operational ranges of the TRITEL telescopes in terms of fluxes, LET and absorbed dose rates
Parameter Flux (isotropic) LET in water Minimum absorbed dose rate in water (for relativistic protons with energy deposit of ≈100 keV in Si) Maximum absorbed dose rate in water (for relativistic protons with energy deposit of ≈100 keV in Si) Maximum absorbed dose rate in water (for Po-210 alpha particles with energy deposit of 5.3 MeV in Si) Maximum absorbed dose rate in water (for particles with energy deposit of 80 MeV in Si)
Value 1.5∙10-1 – 4.5∙104 cm-2s-1 0.2 – 120 keV/μm 50 nGy/h 10 mGy/h 0.5 Gy/h 7 Gy/h
In the ESEO-TRITEL EMC tests only the powered units of the TRITEL EQM will be tested (see Table 6 below) for QUALIFICATION (for ACCEPTANCE test procedure see MTA EKSVL-2015-352-01-11B-00). At later stages the test shall be repeated on the ESEO-TRITEL FM as well for ACCEPTANCE. 6. Table – List of units of the test article
Unit Name ESEO-TRITEL EQM Power Cable (EQM) Communication converter (EQM) PC ESEO-TRITEL LISN
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5.3. ESEO-TRITEL payload electrical interface descriptions The ESEO-TRITEL payload is connected with a POWER CABLE to the onboard power supply of the ESEO satellite and with two, redundant data interface using CAN data protocol. The ESEO-TRITEL hardware is specified for the input voltage range of the ESEO satellite [18.0 V – 25.2 V ±1%]. The ESEO-TRITEL payload electrical interfaces will be Standard density D-SUB9 connectors (see Figure 2 below).
DBF9_S4_2_A_TRITEL DBF9_S4_3_A_TRITEL DBM9_S4_1_A_TRITEL
2. Figure – The ESEO-TRITEL electrical interfaces
The location of the ESEO-TRITEL Payload on-board the satellite is the Bottom Plate [AD 7]. 7. Table – The ESEO-TRITEL input power interface PIN assignment (DBM9_S4_1_A_TRITEL)
PIN 1 2 3 4 5 6 7 8 9
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Description Ground return path/ 0V NC Main power supply NC Ground return path/ 0V (Optional shield) NC Main power supply NC
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8. Table – The ESEO-TRITEL CAN data interface PIN assignment (DBF9_S4_2_A_TRITEL, DBF9_S4_3_A_TRITEL)
PIN 1 2 3 4 5
Description Reserved CANL bus pin V+ (Optional) Reserved CAN_SHLD (Optional shield) V- (Ground return path) CANH bus pin Reserved V+ (optional)
6 7 8 9
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5.4. ESEO-TRITEL switching frequencies The main switch mode power supply of the TRITEL operates at 40 kHz. The TRITEL electronics also include auxiliary power supplies with switching frequencies of around 75 kHz, 190 kHz and 2 MHz. The microcontroller and other digital circuitry of the TRITEL operate with a clock rate of 20 MHz.
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Issue/Rev: 0/0
Level: Qualification
Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5.5. ESEO Harness definitions applicable for the EMC tests The test will be conducted following the ESEO overall Harness definitions [AD 5] see Table 9 below. 9. Table – The ESEO-TRITEL harness definitions
Connector type
Classification
Type of harness
Wire type
Sizing rules
Power cable
Class I
Twisted pair
Axon ET 2019 SPC, Axon ET 2219 SPC, Axon ET 2419 SPC
AWG 22
Data (CAN) cable
Class IV
Twisted shielded pair
Axon ET 2419 SPC
AWG 24
For more details see ECSS-E-HB-20-07A section 5.2.4 [AD 8]. Electrical cable assemblies shall simulate actual installation and usage. All cables shall be supported 5 cm above the ground plane. In case of interconnecting cables at least the first 2 m (except for cables that are shorter in the actual installation) of each interconnecting cable associated with each enclosure of the EUT are run parallel to the front boundary of the setup. Remaining cable lengths are routed to the back of the setup and placed in a zigzagged arrangement. When the setup includes more than one cable, individual cables shall be separated by 2 cm measured from their outer circumference. Two metres of input power leads (including neutrals and returns) shall be routed parallel to the front edge of the setup in the same manner as the interconnecting leads. Each input power lead, including neutrals and returns, shall be connected to a LISN. After the 2 m exposed length, the power leads shall be terminated at the LISNs in such a manner that the total length of power lead from the EUT electrical connector to the LISNs shall not exceed 2.5 m. If the power leads are twisted in the actual installation, they shall be twisted up to the LISNs.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5.6. ESEO-TRITEL LISN used In case of the ESEO-TRITEL EQM/FM Input Power testing the following LISN has to be used.
3. Figure – ESEO-TRITEL LISN used
The LISN enclosure needs to be metallic, and needs to provide a large bonding stud for ground plane connection during EMC tests. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
R4 and R6 need to be 50 Ohm each, while L1 and L2 shall be air core inductors, ~2.5 uH each (2.5uH for L1 and L2 are for sure conservative, a maximum length of the power harness in the order of 60 cm, AWG 20 twisted pair, is expected). R3 and R4 should be in the order of 520 mOhm considering 50% load step (30W), 25V bus voltage and ± 1.25 V bus transient.
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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5.7. General test configuration and measurement tolerances The EUT shall be configured as shown below. If the actual installation is known, the EUT shall be installed on a ground plane that simulates the actual installation. Ground planes shall be 2 m² or larger in area with the smaller side no less than 75 cm. When the EUT is installed on a metallic ground plane, the ground plane shall have a DC surface resistance not larger than 0.1 mOhm per square. The DC resistance between metallic ground planes and the shielded enclosure shall be 2.5 mOhm or less. Only the provisions included in the design of the EUT shall be used to bond units.
4. Figure – Test configuration in general (section 5.2.6.1 of ECSS-E-ST-20-07C Rev. 1)
The tolerance for EMC testing shall be as follows: - Distance: ±5%, - Frequency: ±2%, - Amplitude, measurement receiver: ±2 dB, - Amplitude, measurement system (includes measurement receivers, transducers, cables, connectors): ±3 dB, - Time (waveforms): ±5 %, - Resistors: ±5 %, - Capacitors: ±20 %. Shielded enclosures or unshielded sites are used for testing. Shielded enclosures prevent external environment signals from contaminating emission measurements and susceptibility test signals from interfering with electrical and electronic items near the test facility. Ambient conducted levels on power leads shall be measured with the leads disconnected from the EUT and connected to a resistive load that draws the same rated current as the EUT. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5.8. The CE measurement descriptions The arrangements for CE measurement are presented on the following block diagrams according to the ECCS standards. The needed test equipments for the CE measurement are the follows: - ESEO-TRITEL EQM, - ESEO-TRITEL LISN V01, - Spectrum Analyzer, - Current Clamp, - Selective Level Meter, - Oscilloscope, - Function Generator, - Multimeter, - Power Supply, - Calibration jig, - Test Chamber. Test method is according to the related ECSS-E-ST-20-07C rev1 Standard (sections 5.4.2, 5.4.3). The applied limit values are provided by ALMASpace/SITAEL S.p.a. (ENV-EIDB-6140, ENV-EIDB-6145). Units of measurement for frequency domain emissions measurements shall be reported in units of dB referenced to 1 μV, 1 μA, 1 μV/m, 1 pT depending on the unit defined in the test limit. The limits and the measured CE values has to be reported on the same graphs. For frequency domain plots, emission data shall be reported in graphic form with frequency resolution of 1 %, or twice the measurement receiver bandwidth, whichever is less stringent. In the event of any emissions test result over the emission test limit above 100 MHz, greater accuracy of its frequency shall be reported with resolution better than or equal to twice the measurement bandwidth. Each plot of emission data shall be reported with a minimum amplitude resolution of 1 dB. A peak detector shall be used for all frequency domain emission and susceptibility measurements. During emission measurements, the EUT shall be placed in the operating mode, which produces maximum emissions. Before the measurements the system should be calibrated according to the ECSS-E-ST-20-07C rev.1 section 5.4.2.3 in the frequency range 30 Hz-100 kHz. Calibration fixture (jig) will be needed for the calibration in the frequency range 100 kHz-100 MHz. The calibration fixture (jig) is defined in ECSS-E-ST-20-07C rev.1 section 5.2.8.3 originating from MIL-STD-461E.
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Model: EQM
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5. Figure – Calibration fixture (jig) definitions for CE measurement calibrations above 1 MHz (section 5.2.8.3 of ECSS-E-ST-20-07C Rev. 1)
The calibration has to be done on the following frequencies: 100 Hz (1 Ohm), 1 kHz (1 Ohm), 100 kHz (10 Ohm), 1 MHz (jig), 10 MHz (jig), 30 MHz (jig). The calibrated signal level should be at least 6 dB below the emission limit to the current probe. Verify that the applied current waveform is sinusoidal. Verify that the data recording device indicates a level within ±3 dB of the injected level.
6. Figure – Setup for measurement system check, conducted emission measurement, 30 Hz to 100 kHz (section 5.4.2.3 of ECSS-E-ST-20-07C Rev. 1)
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Model: EQM
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
7. Figure – Setup for measurement system check, conducted emission measurement, 100 kHz to 100 MHz (section 5.4.3.3 of ECSS-E-ST-20-07C Rev. 1)
8. Figure – Setup for conducted emission measurement, differential mode, 30 Hz to 100 MHz (section 5.4.3.3 of ECSS-E-ST-20-07C Rev. 1)
9. Figure – Setup for conducted emission measurement, common mode, 100 kHz to 100 MHz (section 5.4.3.3 of ECSS-E-ST-20-07C Rev. 1)
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Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
The following Table summarize the bandwidth and measurement time requirements for emission measurements originating from ECSS-E-ST-20-07C rev.1 section 5.2.9.1. These bandwidths are specified at the 6 dB down points for the overall selectivity curve of the receivers. 10. Table – The scan parameters of the measurement receiver
Frequency Range 30 Hz - 1 kHz 1 kHz - 10 kHz 10 kHz - 150 kHz 150 kHz - 30 MHz 30 MHz - 100 MHz
6 dB bandwidth 10 Hz 100 Hz 1 kHz 10 kHz 100 kHz
Dwell time 0.15 s 0.015 s 0.015 s 0.015 s 0.015 s
Minimum measurement time (analogue measurement receiver) 0.015 s/Hz 0.15 s/kHz 0.015 s/kHz 1.5 s/MHz 0.15 s/MHz
Minimum measurement time for analogue measurement receivers during emission testing shall be as specified in Table 10. Synthesized measurement receivers shall step in one-half bandwidth increments or less, and the measurement dwell time shall be as specified in Table 10. Before the CE measurements should be applied for the system check according to the section 5.4.2.4 of ECSS-E-ST-20-07C Rev.1. After that the differential mode CE disturbance measurement should be performed and the common mode CE disturbance measurement should be performed according to the above described arrangements.
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Model: EQM
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5.9. Inrush current measurement descriptions The arrangements for inrush current measurement are presented on the following block diagrams according to the ECCS standards. The needed test equipments for the inrush current measurements are the follows: - ESEO-TRITEL EQM, - ESEO-TRITEL LISN V01, - Transient Tester, - Coupling Device, - Oscilloscope, - Current Probe, - Current Probe Amplifier, - Multimeter, - Power Supply, - Test Chamber. Test method is according to the related ECSS-E-ST-20-07C rev1 Standard (sections 5.4.4). The applied limit values are provided by ALMASpace/SITAEL S.p.a. (ENV-EIDB-6150). Data presentation shall be a graphic output of current versus time displaying the transient characteristics with following conditions: - amplitude resolution within 3 % of the applicable limit, - time base resolution within 10 % of rise time for measurement of rise and fall slopes (rise time is the duration between 10 % and 90 % of peak‐to‐peak amplitude). Two separate displays shall be provided showing respectively the initial rise time and the full inrush response: - 10 μs full scale for the initial rise time, - 1 ms full scale for the full inrush response. A calibration/system check has to be provided shown below. Apply a calibrated spike that is at least 6 dB below the applicable limit to the current probe. Apply through the current probe a DC current equivalent to the EUT supply current. The DC current is applied for verifying that the current probe will not be saturated by the EUT DC supply current. This DC current is applied through the LISN for applying the same impedance through the probe as with the EUT. Check the spike current as measured with the probe by comparison with the voltage across the resistor. Perform the measurement with the current probe on an oscilloscope in the same manner as for EUT testing and verify that the data‐recording device indicates a level within ±3 dB of the injected level.
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Date: 15/10/2015
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Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
10. Figure – Setup for measurement system check, inrush current measurement (section 5.4.4.3 of ECSS-E-ST-20-07C Rev. 1)
11. Figure – Setup for inrush current measurement (section 5.4.4.3 of ECSS-E-ST-20-07C Rev. 1)
Before the inrush current measurement the arrangement of Figure 7 will be applied for the system check according to the section 5.4.4.3 of ECSS-E-ST-20_07C Rev.1. After that the inrush current measurement will be performed as seen on Figure 8.
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Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
5.10.The CS measurement descriptions The arrangements for CS test are presented on the following block diagrams according to the ECCS standards. The needed test equipments for the CS measurements are the follows: - ESEO-TRITEL EQM, - ESEO-TRITEL LISN, - Conducted Immunity Tester, - Current Injector, - Level Generator, - LF Generator, - Amplifier, - Oscilloscope, - Function Generator, - Current Probe, - Current Probe Amplifier, - Test Chamber, - Power Supply, - Regulated Power Supply, - PC. Test method is according to the related ECSS-E-ST-20-07C rev.1 Standard (sections 5.4.7 and 5.4.8). The applied limit values are provided by ALMASpace/SITAEL S.p.a. (ENV-EIDB-6155, ENV-EIDB-6160). Data showing the frequencies and amplitudes at which the test was conducted shall be provided in graphical or tabular form. Indications of compliance with the requirements shall be provided (such indications can be provision of oscilloscope plots of injected waveforms with test data). Data shall be reported with frequency resolution of 1 %. Data shall be provided with a minimum amplitude resolution of 1 dB for each plot. If susceptibility is observed, determined levels of susceptibility shall be recorded in the test report. During susceptibility testing, the EUT shall be placed in its most susceptible operating mode. The EUT shall be monitored during susceptibility testing for indications of degradation or malfunction. Stepped scans shall dwell at each tuned frequency for the greatest of three seconds or the EUT response time. Ten frequency steps per decade can be used as a basis (ECSS-E-ST-20-07C rev.1 section 5.2.10.1b). Better to have quite small frequency steps, the duration of the signal at a certain frequency has to be such that it is sure that the susceptibility of the electronics is eventually File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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stimulated. Based on the sampling theorem the very minimum duration is the double of the inverse of the sampling frequency. In addition to these sampled frequencies, shall be included all the frequencies reported in the ESEO EMC control plan (AS-12-0005-SYS-PL-07, page 26): - 14.7456 MHz (Local Oscillator); - 1.2288 MHz (ADC clock); - 307.2 kHz (Intermediate Frequency); - 25 MHz (System clock); - 180-230 kHz (DC/DC switch frequency); - 2-5 kHz (S3R frequency); - 45 MHz (1st Intermediate Frequency); - 455 kHz (2nd Intermediate Frequency); - 27-41 MHz (Local Oscillator). Susceptibility test signals shall be pulse modulated (on/off ratio of 40 dB minimum) at a 1 kHz rate with a 50 % duty cycle for susceptibility signals at a frequency larger than 100 kHz. When susceptibility indications are noted in EUT operation, a threshold level shall be determined as follows where the susceptible condition is no longer present. Check measurement system by configuring the test equipment in accordance with Figure below in the frequency range of 30 Hz – 100 kHz, and setting up the oscilloscope to monitor the voltage across the resistor. Set the signal generator to the lowest test frequency (30 Hz). Increase the applied signal until the oscilloscope indicates the voltage level specified by, verify that the output waveform is sinusoidal, and verify that the indication given by the current probe is within 3 dB of the expected level derived from the 1 Ohm resistor voltage. Repeat the sequence by setting the signal generator to the highest test frequency (100 kHz).
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
12. Figure – Setup for measurement system check, conducted susceptibility measurement, 30 Hz to 100 kHz (section 5.4.7.3 of ECSS-E-ST-20-07C Rev. 1)
Do the test for each power lead (differential CS).
13. Figure – Setup for conducted susceptibility measurement, 30 Hz to 100 kHz (section 5.4.7.3 of ECSS-E-ST-20-07C Rev. 1)
A calibration/system check has to be provided in the frequency range of 100 kHz – 100 MHz. Place the injection probe and the monitor probe around the central conductor of their respective jigs. Terminate one end of the jig with a 50 Ohm‐coaxial load and connect the other end to a 50 Ohm‐input oscilloscope. If a current monitor probe is used, connect it to another 50 Ohm File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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oscilloscope input. Set the frequency of the generator to 50 kHz and apply the pulse modulation. Increase the applied signal until the oscilloscope indicates the voltage specified by application. Record the generator settings. Repeat for each measurement frequency settings. The calibration need not be re‐performed before testing each EUT bundle.
14. Figure – Setup for measurement system calibration, conducted susceptibility measurement, 50 kHz to 100 MHz (section 5.4.8.3 of ECSS-E-ST-20-07C Rev. 1)
Place the injection and monitor probes around a cable bundle interfacing an EUT connector. 5 cm from the connector if the overall length of the connector and backshell does not exceed 5 cm. Position the injection probe 5 cm from the monitor probe. Set the modulated sine generator to a test frequency, at low output level. Adjust the modulation in duty cycle and frequency. Increase the generator output to the level determined during calibration, without exceeding the current limit specified by application. Record the peak voltage applied. Monitor the EUT for degradation of performance. Repeat for each measurement frequency settings.
15. Figure – Test waveform for conducted susceptibility measurement, 50 kHz to 100 MHz (section 5.4.8.3 of ECSS-E-ST-20-07C Rev. 1)
The modulation parameters is given in below. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
11. Table – The CS modulation parameters in the frequency range of 50 kHz-100 MHz
Band
50 kHz-1 MHz 1 MHz-10 MHz 10 MHz-100 MHz
Modulation PM % frequencies
1 kHz 100 kHz 100 kHz
50 20 5
16. Figure – Setup for conducted susceptibility measurement, 50 kHz to 100 MHz (section 5.4.8.3 of ECSS-E-ST-20-07C Rev. 1)
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5.11.CS Spike transient measurement description The arrangements for CS test are presented on the following block diagrams according to the ECCS standards. The needed test equipments for the CS measurements are the follows: - ESEO-TRITEL EQM, - ESEO-TRITEL LISN V01, - Transient Tester, - Coupling Device, - Oscilloscope, - Power Supply, - Test Chamber, - PC. Test method is according to the related ECSS-E-ST-20-07C rev1 Standard (sections 5.4.9). The applied limit values are provided by ALMASpace/SITAEL S.p.a. (ENV-EIDB-6165). The spike generator need to have the following characteristics: - pulse width of 10 μs and 0.15 μs, - pulse repetition rate capability up to 10 pulses per second, - voltage output as required, positive then negative. Configure the test equipment for verification of the waveform. Set up the oscilloscope to monitor the voltage across the 5 Ohm resistor. Adjust the pulse generator for the pulse width, and pulse repetition rate. Adjust the amplitude of the signal to the level specified in associated limit. Verify that the waveform complies with the requirements, if not, correct accordingly. Record the pulse generator amplitude setting.
17. Figure – Setup for measurement system check, conducted susceptibility measurement, transients (section 5.4.9.3 of ECSS-E-ST-20-07C Rev. 1) File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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Two possible method can be followed during the testing: - series injection, - parallel injection. Adjust the spike generator to a pulse duration. Apply the test signal to each power lead and increase the generator output level to provide the specified voltage without exceeding the pulsed amplitude setting recorded during calibration. Apply repetitive (6 to 10 pulses per second) positive spikes to the EUT ungrounded input lines for a period not less than 2 minutes in duration, and if the equipment employ gated circuitry, trigger the spike to occur within the time frame of the gate. Repeat with negative spikes. Monitor the EUT for degradation of performance. Record the peak current as indicated on the oscilloscope. Repeat on each power lead.
18. Figure – Setup for conducted susceptibility measurement, transients, series injection (section 5.4.9.3 of ECSS-E-ST-20-07C Rev. 1)
19. Figure – Setup for conducted susceptibility measurement, transients, parallel injection (section 5.4.9.3 of ECSS-E-ST-20-07C Rev. 1) File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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6. Test conditions 6.1. General The test location for the ESEO-TRITEL EMC Tests are the T-Network EMC Laboratory of the T-Network Kft. Address: Ungvár u. 64-66, H-1142, Budapest, Hungary. the MTA EK Laboratory Address: Konkoly-Thege Miklós u. 29-33, H-1121, Budapest, Hungary. The tests were performed on - 5-9 of October 2015. The test run specifications are hereby provided. Environment: - pressure: atmospheric - temperature: ambient - relative humidity: 50% ± 10% Cleanliness level:
visible clean
Test equipment and instrumentations as well as test items are inspected for visible cleanliness, where "Visible clean" means: “Absence of Contamination when examined with a specific light source, angle of incidence and viewing distance using normal or magnified vision.” (Reference ESA ECSS-Q-70-01, draft, 19 June 2002).
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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6.2. Test tolerances and accuracies The test tolerances and accuracies were identified based on ECSS-E-ST-10-03C section 4.4.2 and 4.4.3 and based on ECSS-E-ST-20-07C section 5.2.1. 12. Table – Allowable test tolerances
Test parameters Relative humidity Ambient pressure Test duration Frequency Amplitude Time (waveforms) Resistors Capacitors Input voltage level
Tolerances ± 10% ± 10% -0 / + 10% ± 2% ± 2 dB ± 5% ± 5% ± 20% ± 2% or ±1 V whichever is greater (see ECSS-E-20A section 5.7.1f)
13. Table – Allowable test accuracies
Test parameters Frequency Amplitude Time (waveforms) Resistors Capacitors Voltage Current
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Accuracies ± 2% ± 2 dB ± 5% ± 5% ± 20% ± 0.01V ± 0.1 mA
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QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
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6.3. Test program activities The major test activities and the planned sequence are here reported 1 - Instrumentation checkout. Test equipment is verified to be in compliant with the relevant test requirements and within the normal calibration period. 2 - Test configuration and conditions record. All relevant test information are collected in a dedicated logbook 3 - Test execution. As reported in the test procedure (see section 5.1).
6.4. Inspections Visual inspections are foreseen after each test run on the test units to look for signs of damage to the structure and / or the instrumentation.
6.5. Quality Assurance All equipment/instrumentation to be used for testing is subjected to the approved calibration procedures and is within the normal calibration period at the time of the test.
6.6. Documentation This document reports the overall test program. The test results shall be documented in a separated test result document with following items to be included: Description of facility equipment and instrumentation, including photographs of test set-up; Instrumentation settings applied for the test; Test personnel list and responsibility; Registrations of the environmental conditions during the course of the test program (temperature, humidity, and cleanliness); Signed copy of the step by step test procedure; Test data gathered during the test; Signed procedure variation sheets (if any); Signed test completion certificate.
6.7. Pictures During the test preparation activities and execution pictures of the test set-up shall be made by the test personnel.
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Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
7. Instrumentation and Test Equipment Following test equipment and instrumentation are to be used. 14. Table – Used instrumentations
No 1
2 3 4 5 6 7 8
Description/Type Tektronix A6302 Current Probe and Tektronix AM503 Current Probe Amplifier Kikusui 5502U Oscilloscope Anritsu Signal Generator R&S ESCS EMC Receiver with data recorder ESO-TRITEL LISN EMC Partner TRA2000 Surge Spike Generator HIFI Audio Power Amplifier Power Supply Voltcraft DIGI 35 CPU
Range
Accuracy
Calibration information
max 20A (DC + peak AC)
Sensitivity with oscilloscope @ 10 mV/div: 1 mA/div to 5 A/div
TBW
N/A
N/A
N/A
TBW
TBW
TBW
TBW
TBW
TBW
See section 5.2. TBW
TBW
TBW
TBW
TBW
TBW
0 ÷ 35 [V] 0 ÷ 2.55 [A]
± 50 [mV] ± 10 [mA]
TBW
The instrumentation shall be within the normal calibration period at the time of the test. The following picture shows the used instrumentations.
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MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
20. Figure – R&S ESCS EMC Receiver with data recorder
21. Figure – EMC Partner TRA2000 Surge Spike Generator
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Date: 15/10/2015
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Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
22. Figure – Anritsu ML422C Selective Level Meter
23. Figure – CIT-10 Conducted Immunity Tester
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MTA EK SVL
Date: 15/10/2015
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Level: Qualification
Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
24. Figure – HP 3310A Function Generator
25. Figure – Tektronix DPO 4104 Oscilloscope File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
26. Figure – Anritsu MG4438 Synthesizer/Level Generator
27. Figure – Matrix DDS Function Generator
8. Mode of operation During the tests, the mode of operation of the ESEO-TRITEL experiment is in principle the same as on board the ESEO.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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MTA EK SVL
Date: 15/10/2015
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Model: EQM
Centre for Energy Research, Hungarian Academy of Sciences ESEO-TRITEL Team
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
9. Step-by-step procedure 15. Table – Step-by-step procedure 1 - Conducted emission measurements in the 30 Hz to 100 kHz frequency range
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system check
Level/ Model
Report
Check
Notes
Pass/Fail
1.1 Prepare the measurement system check setup as shown in 6. Figure.
Qua./ EQM
Photo of test configuration
See ANNEX I, page 9, Figure 7.
-
N/A
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
1.3 Apply a calibrated signal level, at 1 kHz and 100 kHz, which is at least 6 dB below the emission limit to the current probe.
Qua./ EQM
Report the calibration signal parameters.
See ANNEX, page 7, Figures 1-3.
Applied level at 1 kHz and 100 kHz were 620 mV RMS.
N/A
Done.
1: A DC current is applied for verifying that the current probe will not be saturated by the EUT DC supply current. 2: This DC current is applied through the LISN for applying the same impedance through the probe as with the EUT.
N/A
Action
1.4 Apply through the current probe a DC current equivalent to the EUT supply current.
Qua./ EQM
-
Date/Sign 05/10/2015 05/10/2015
05/10/2015
05/10/2015
The material is the intellectual property of the Centre for Energy Research, Hungarian Academy of Sciences. Unauthorized use is not permitted. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
1.0
2.0
3.0
Activity Measurement system check
Measurement preparation
Conducted emission measurement on the TRITEL power input lead
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report the measured oscilloscope waveforms.
See ANNEX I page 7, Figures 1-3.
50 Ohm was used.
PASS
Qua./ EQM
Only non-conformances shall be reported.
No non-conformances have been found.
-
PASS
Qua./ EQM
Only non-conformances shall be reported.
No non-conformances have been found.
-
PASS
2.1 Prepare the measurement setup as shown in 8. Figure
Qua./ EQM
Photo of measurement configuration
See ANNEX I, page 11, Figure 10.
-
N/A
2.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized.
Qua./ EQM
-
Done.
-
N/A
3.1 Clamp the current probe into position on the TRITEL power input lead.
Qua./ EQM
-
Done.
-
N/A
Action 1.5 Verify the AC current level as measured with the probe by comparison with voltage across the 1 Ohm resistor at 1 kHz and the 10 Ohm resistor at 100 kHz; also, verify that the current waveform is sinusoidal. 1.6 Scan the measurement receiver for each frequency in the same manner as a normal data can. Verify that the data-recording device indicates a level within ±3 dB of the injected level. 1.7 If readings are obtained which deviate by more than ±3 dB, locate the source of the error and correct the deficiency prior to proceeding with the testing.
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Date/Sign 05/10/2015
05/10/2015
05/10/2015
05/10/2015 05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
3.0
Conducted emission measurement on the TRITEL power input lead
3.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
4.0
Conducted emission measurement on the TRITEL power return lead
4.1 Clamp the current probe into position on the TRITEL power return lead.
4.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 14, Figure 19
See ENV-EIDB6140 for pass/fail criteria.
PASS
Qua./ EQM
-
Done.
-
N/A
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 16 Figure 21.
See ENV-EIDB6140 for pass/fail criteria.
PASS
Qua./ EQM
50/74
Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
16. Table – Step-by-step procedure 2 - Conducted emission measurements in the 100 kHz to 100 MHz frequency range
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system check
Level/ Model
Report
Check
Notes
Pass/Fail
1.1 Prepare the measurement system check setup as shown 7. Figure
Qua./ EQM
Photo of test configuration
See ANNEX I, page 9, Figure 8.
-
N/A
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
See ANNEX, page 8, Figures 4-6.
Calibration jig was not available. Calibration bridge was used instead. See ANNEX I, page 10, Figure 9.
N/A
Done.
1: A DC current is applied for verifying that the current probe will not be saturated by the EUT DC supply current. 2: This DC current is applied through the LISN for applying the same impedance through the probe as with the EUT.
N/A
Action
1.3 Apply a calibrated signal level that is at least 6 dB below the applicable limit at 1 MHz and 10 MHz or at a level above the noise reading on the oscilloscope, whatever is greater, to the current probe in the jig.
1.4 Apply through the current probe using a second wire, a DC current equivalent to the EUT nominal supply current.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Qua./ EQM
Qua./ EQM
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Report the calibration signal parameters.
-
Date/Sign 05/10/2015 05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
Level/ Model
Report
Check
Notes
Pass/Fail
1.0
Measurement system check
1.5 Verify the AC current level, as measured with the probe by comparison with the voltage on the T derivation.
Qua./ EQM
Report the measured oscilloscope waveforms.
See ANNEX, page 8, Figures 4-6.
-
PASS
1.6 Scan the measurement receiver for each frequency in the same manner as a normal data scan, and verify that the data-recording device indicates a level within ±3 dB of the injected level.
Qua./ EQM
Only non-conformances shall be reported.
No nonconformances have been found.
-
PASS
1.7 If readings are obtained which deviate by more than ±3 dB, locate the source of the error and correct the deficiency prior to proceeding with the testing.
Qua./ EQM
Only non-conformances shall be reported.
No nonconformances have been found.
-
PASS
2.1 Prepare the measurement setup as shown in 9. Figure.
Qua./ EQM
Photo of measurement configuration
See ANNEX I, page 11, Figure 10. Figure 11.
-
N/A
2.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized.
Qua./ EQM
-
Done.
-
N/A
2.0
Measurement preparation
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Date/Sign 05/10/2015
05/10/2015
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
Level/ Model
Report
Check
Notes
Pass/Fail
3.0
Conducted emission measurement on the TRITEL power input lead in differential mode
3.1 Clamp the current probe into position on the TRITEL power input lead.
Qua./ EQM
-
Done.
-
N/A
See ENV-EIDB6140 for pass/fail criteria.
PASS
-
N/A
4.0
Conducted emission measurement on the TRITEL power return lead in differential mode
3.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 15, Figure 20
4.1 Clamp the current probe into position on the TRITEL power return lead.
Qua./ EQM
-
Done.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
4.0
5.0
Activity Conducted emission measurement on the TRITEL power return lead in differential mode Conducted emission measurement on the CANH lead of the CAN A connector in differential mode
Action 4.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
5.1 Clamp the current probe into position on the CANH lead of the CAN A connector.
5.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 17, Figure 22
See ENV-EIDB6140 for pass/fail criteria.
PASS
Qua./ EQM
-
Done.
-
N/A
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 24, Figure 25
See ENV-EIDB6140 for pass/fail criteria
PASS
Qua./ EQM
54/74
Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
Level/ Model
Report
Check
Notes
Pass/Fail
6.0
Conducted emission measurement on the CANL lead of the CAN A connector in differential mode
6.1 Clamp the current probe into position on the CANL lead of the CAN A connector.
Qua./ EQM
-
Done.
-
N/A
See ENV-EIDB6140 for pass/fail criteria
PASS
-
N/A
7.0
Conducted emission measurement on the ground lead of the CAN A connector in differential mode
6.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 26, Figure 27
7.1 Clamp the current probe into position on the ground lead of the CAN A connector.
Qua./ EQM
-
Done.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
7.0
8.0
Activity Conducted emission measurement on the ground lead of the CAN A connector in differential mode Conducted emission measurement on the CANH lead of the CAN B connector in differential mode
Action
Level/ Model
Report
Check
Notes
Pass/Fail
See ENV-EIDB6140 for pass/fail criteria
PASS
7.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 28, Figure 29
8.1 Clamp the current probe into position on the CANH lead of the CAN B connector.
Qua./ EQM
-
Done.
-
N/A
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 32, Figure 33
See ENV-EIDB6140 for pass/fail criteria
PASS
8.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Qua./ EQM
56/74
Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
Level/ Model
Report
Check
Notes
Pass/Fail
9.0
Conducted emission measurement on the CANL lead of the CAN B connector in differential mode
9.1 Clamp the current probe into position on the CANL lead of the CAN B connector.
Qua./ EQM
-
Done.
-
N/A
See ENV-EIDB6140 for pass/fail criteria
PASS
-
N/A
10.0
Conducted emission measurement on the ground lead of the CAN B connector in differential mode
9.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 34, Figure 35
10.1 Clamp the current probe into position on the ground lead of the CAN B connector.
Qua./ EQM
-
Done.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
10.0
Conducted emission measurement on the ground lead of the CAN B connector in differential mode
11.0
Measurement preparation
12.0
Conducted emission measurement on the TRITEL power input lead bundle in common mode
Action
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 36, Figure 37
See ENV-EIDB6140 for pass/fail criteria
PASS
11.1 Prepare the measurement setup as shown in 9. Figure.
Qua./ EQM
Photo of measurement configuration
See ANNEX I, page 12, Figure 12 Figure 13.
-
N/A
11.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized.
Qua./ EQM
-
Done.
-
N/A
12.1 Clamp the current probe into position on the TRITEL power input lead bundle.
Qua./ EQM
-
Done.
-
N/A
10.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
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Date/Sign
05/10/2015
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
12.0
Conducted emission measurement on the TRITEL power input lead bundle in common mode
13.0
Conducted emission measurement on the TRITEL CAN A lead bundle in common mode
Action
12.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
13.1 Clamp the current probe into position on the TRITEL CAN A lead bundle.
13.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 18, Figure 23
See ENV-EIDB6145 for pass/fail criteria
PASS
Qua./ EQM
-
Done.
-
N/A
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 30, Figure 31
See ENV-EIDB6145 for pass/fail criteria
PASS
Qua./ EQM
59/74
Date/Sign
05/10/2015
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
14.0
Conducted emission measurement on the TRITEL CAN B lead bundle in common mode
Action
14.1 Clamp the current probe into position on the TRITEL CAN B lead bundle.
14.2 Scan the measurement receiver over the frequency range, using the bandwidths and minimum measurement times specified in 10. Table. 18V and 25V input voltage should be measured.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
-
Done.
-
N/A
Report recorded data and the scan parameters.
For scan parameters see ANNEX I page 10, Table 3. For CE results see ANNEX I Figure 38, Figure 39
See ENV-EIDB6145 for pass/fail criteria
PASS
Qua./ EQM
60/74
Date/Sign
05/10/2015
05/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
17. Table – Step-by-step procedure 3 - Inrush current measurements
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system check
Level/ Model
Report
Check
Notes
Pass/Fail
1.1 Prepare the measurement system check setup as shown in 10. Figure.
Qua./ EQM
Photo of test configuration
See ANNEX I, page 47, Figure 69.
-
N/A
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
1.3 Apply a calibrated spike that is at least 6 dB below the applicable limit to the current probe.
Qua./ EQM
Report the applied calibration spike parameters.
U=232 V through 40 Ohm resulted 5.8 A peak.
-
N/A
N/A
PASS
Action
1.4 Apply through the current probe a DC current equivalent to the EUT supply current.
Qua./ EQM
-
Done.
1: A DC current is applied for verifying that the current probe will not be saturated by the EUT DC supply current. 2: This DC current is applied through the LISN for applying the same impedance through the probe as with the EUT.
1.5 Check the spike current as measured with the probe by comparison with the voltage across the resistor.
Qua./ EQM
Report the measured spike current.
See ANNEX I, page 47, Figure 70.
-
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
61/74
Date/Sign 06/10/2015 06/10/2015
06/10/2015
06/10/2015
06/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
1.0
2.0
3.0
Activity
Measurement system check
Measurement preparation
Inrush current measurement on the TRITEL power input lead
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Only nonconformances shall be reported.
See ANNEX I, page 47, Figure 70.
-
PASS
Qua./ EQM
Only nonconformances shall be reported.
Done.
-
PASS
2.1 Prepare the measurement setup as shown in 11. Figure.
Qua./ EQM
Photo of measurement configuration.
See ANNEX I, page 48, Figure 71.
-
N/A
2.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
3.1 Clamp the current probe into position on the positive power input lead.
Qua./ EQM
-
Done.
-
N/A
3.2 Perform measurement by application of power on the TRITEL using a mercury relay (Fig 11.a), or the power controller (Fig 11.c).
Qua./ EQM
Report the captured voltage and inrush current waveforms, and the integrated input power energy.
For Inrush Current results see ANNEX I Figure 72-75.
See ENV-EIDB6150 for pass/fail criteria
PASS
Action 1.6 Perform the measurement with the current probe on an oscilloscope in the same manner as for EUT testing and verify that the data-recording device indicates a level within ±3 dB of the injected level. 1.7 If readings are obtained which deviate by more than ±3 dB, locate the source of the error and correct the deficiency prior to proceeding with the testing.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
62/74
Date/Sign 06/10/2015
06/10/2015
08/10/2015 08/10/2015
08/10/2015
08/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
18. Table – Step-by-step procedure 4 - Differential mode conducted susceptibility measurements in the 30 Hz to 100 kHz frequency range
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system check
Level/ Model
Report
Check
Notes
Pass/Fail
1.1 Prepare the measurement system check setup as shown in 12. Figure.
Qua./ EQM
Photo of test configuration
See ANNEX I, page 30, Figure 42.
-
N/A
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
1.3 Set the signal generator to the lowest test frequency.
Qua./ EQM
-
Done.
30 Hz.
N/A
Qua./ EQM
Report the output waveform. Non-conformances shall be reported.
See ANNEX I, page 29, Figure 40.
1.0 Vrms through 1 Ohm.
PASS
Qua./ EQM
-
Done.
100 kHz.
N/A
Qua./ EQM
Report the output waveform. Non-conformances shall be reported.
See ANNEX I, page 29, Figure 41.
1.0 Vrms through 10 Ohm.
PASS
Action
1.4 Increase the applied signal until the oscilloscope indicates the voltage level specified by ENV-EIDB-6155, verify that the output waveform is sinusoidal, and verify that the indication given by the current probe is within 3 dB of the expected level derived from the 1 Ohm resistor voltage. 1.5 Set the signal generator to the highest test frequency. 1.6 Increase the applied signal until the oscilloscope indicates the voltage level specified by ENV-EIDB-6155, verify that the output waveform is sinusoidal, and verify that the indication given by the current probe is within 3 dB of the expected level derived from the 1 Ohm resistor voltage. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
63/74
Date/Sign 09/10/2015 09/10/2015 09/10/2015
09/10/2015
09/10/2015
09/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
2.0
Measurement preparation
3.0
Conducted susceptibility measurement on the TRITEL power input lead
Level/ Model
Report
2.1 Prepare the measurement setup as shown in 13. Figure.
Qua./ EQM
Photo of measurement configuration
2.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized. 3.1 Set the signal generator to the lowest test frequency, and increase the signal level until the testing voltage or current limit specified by ENV-EIDB-6155, is reached on the power input lead. Repeat this step at all frequency steps through the testing frequency range.
Qua./ EQM
-
Qua./ EQM
Frequency step parameters shall be reported.
Action
3.2 Monitor the TRITEL for degradation of performance.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Qua./ EQM
64/74
Only non-conformances shall be reported.
Check
Notes
Pass/Fail
-
N/A
Done.
-
N/A
For CS test parameters see ANNEX I, page 30, Table 5.
-
N/A
No performance degradation has been identified.
If susceptibility is noted, determine the threshold level in accordance with 5.2.10.3. of ECSS-E-ST-2007C Rev. 1
PASS
Date/Sign 09/10/2015 09/10/2015
09/10/2015
09/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
19. Table – Step-by-step procedure 5 - Common mode conducted susceptibility measurements in the 50 kHz to 100 MHz frequency range
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system calibration
Action
Level/ Model
Report
Check
Notes
Pass/Fail
N/A
1.1 Prepare the measurement system calibration setup as shown in 14. Figure.
Qua./ EQM
Photo of calibration configuration
See ANNEX I, Figure 50-61.
No calibration jig was available. Oscilloscope checking has been applied.
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
1.3 Set the frequency of the generator to 50 kHz and apply the pulse modulation as defined in 15. Figure and 11. Table.
Qua./ EQM
-
See ANNEX I, Figure 50-61.
-
N/A
1.4 Increase the applied signal until the oscilloscope indicates the voltage specified by ENV-EIDB-6160.
Qua./ EQM
-
Done.
-
N/A
1.5 Verify that both inputs of the oscilloscope, voltage monitored on 50 Ohm and current monitored by the current probe, are consistent within 3 dB. This is applicable only if a current probe is used during calibration.
Qua./ EQM
Report the oscilloscope waveform. Non-conformances shall be reported.
See ANNEX I, Figure 50-61.
-
PASS
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
65/74
Date/Sign 06/10/2015
06/10/2015
06/10/2015
06/10/2015
06/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
1.0
Measurement system calibration
Level/ Model
Report
Qua./ EQM
Report the applied generator settings.
Qua./ EQM
Report generator settings and frequency steps.
Qua./ EQM
Photo of measurement configuration
2.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized.
Qua./ EQM
-
3.1 Select the TRITEL power input lead bundle for testing and clamp the current probes into position.
Qua./ EQM
3.2 Set the modulated sine generator to a test frequency, at low output level. 3.3 Adjust the modulation in duty cycle and frequency as specified in 11. Table.
Action 1.6 Record the generator settings. 1.7 Repeat 1.4 through 1.6 for each measurement frequency.
2.0
3.0
Measurement preparation
Conducted susceptibility measurement on the TRITEL power input leads, bulk cable injection
2.1 Prepare the measurement setup as shown in 16. Figure.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Notes
Pass/Fail
-
N/A
-
N/A
-
N/A
Done.
-
N/A
-
Done.
-
N/A
Qua./ EQM
-
Done.
-
N/A
Qua./ EQM
-
Done.
-
N/A
66/74
Check See ANNEX I, page 39, Table 6. See ANNEX I, page 39, Table 6. See ANNEX I, Figure 62, Figure 63.
Date/Sign 06/10/2015 06/10/2015 06/10/2015
06/10/2015
06/10/2015
06/10/2015
06/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
3.0
Conducted susceptibility measurement on the TRITEL power input leads, bulk cable injection
4.0
Conducted susceptibility measurement on the TRITEL CAN bus leads, bulk cable injection
Action 3.4 Increase the generator output to the level determined during calibration, without exceeding the current limit specified by ENV-EIDB-6160 and record the peak voltage obtained.
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report the peak voltage obtained.
For the peak voltages see ANNEX I, Figure 50-55.
-
N/A
PASS
3.5 Monitor the TRITEL for degradation of performance.
Qua./ EQM
Only non-conformances shall be reported.
No performance degradation has been identified.
If susceptibility is noted, determine the threshold level as measured by the current monitor probe in accordance with 5.2.10.3. of ECSS-E-ST-2007C Rev. 1
3.6 Repeat 3.2 through 3.5 for each test frequency
Qua./ EQM
Only non-conformances shall be reported.
No performance degradation has been identified.
-
PASS
4.1 Select the TRITEL CAN A and CAN B lead bundles for testing and clamp the current probes into position.
Qua./ EQM
-
Done.
-
N/A
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
67/74
Date/Sign
06/10/2015
06/10/2015
06/10/2015
06/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
4.0
Conducted susceptibility measurement on the TRITEL CAN bus leads, bulk cable injection
Action 4.2 Set the modulated sine generator to a test frequency, at low output level.
4.3 Adjust the modulation in duty cycle and frequency as specified in 11. Table. 4.4 Increase the generator output to the level determined during calibration, without exceeding the current limit specified by ENV-EIDB-6160 and record the peak current obtained.
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
-
Done.
-
N/A
Qua./ EQM
Report the applied parameters.
Done.
-
N/A
Qua./ EQM
Report the peak voltage obtained.
For the peak voltages see ANNEX I, Figure 56-61.
-
N/A
PASS
PASS
4.5 Monitor the TRITEL for degradation of performance.
Qua./ EQM
Only non-conformances shall be reported.
No performance degradation has been identified.
If susceptibility is noted, determine the threshold level as measured by the current monitor probe in accordance with 5.2.10.3. of ECSS-E-ST-2007C Rev. 1
4.6 Repeat 4.2 through 4.5 for each test frequency
Qua./ EQM
Only non-conformances shall be reported.
No performance degradation has been identified.
-
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
68/74
Date/Sign
06/10/2015
06/10/2015
06/10/2015
06/10/2015
06/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
20. Table – Step-by-step procedure 6 - Spike transient conducted susceptibility measurements
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
1.0
Activity Measurement system calibration
Level/ Model
Report
Check
Notes
Pass/Fail
1.1 Prepare the measurement system calibration setup as shown in 17. Figure. 1.2
Qua./ EQM
Photo of calibration configuration
See ANNEX I, page 42, Figure 64.
-
N/A
1.2 Turn on the measurement equipment and wait until it is stabilized.
Qua./ EQM
-
Done.
-
N/A
1.3 Adjust the pulse generator for the pulse width, and pulse repetition rate.
Qua./ EQM
-
Done.
-
N/A
1.4 Adjust the amplitude of the signal to the level specified in ENV-EIDA-6165.
Qua./ EQM
-
Done.
-
N/A
1.5 Verify that the waveform complies with the requirements, if not, correct accordingly.
Qua./ EQM
Only non-conformances shall be reported.
Done.
-
PASS
1.6 Record the pulse generator amplitude setting.
Qua./ EQM
Report generator settings.
For the settings see ANNEX I, page 42, section 4.2.
-
N/A
Action
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
69/74
Date/Sign 07/10/2015
07/10/2015
07/10/2015
07/10/2015
07/10/2015
07/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
2.0
3.0
Activity
Measurement preparation
Spike transient conducted susceptibility measurement on the TRITEL power leads
Action
Level/ Model
Report
Check
Notes
Pass/Fail
N/A
2.1 Prepare the measurement setup as shown in 19. Figure.
Qua./ EQM
Photo of measurement configuration
See ANNEX I, page 42, Figure 64.
1: With series injection, the internal LISN capacitor at the input power side is protecting the source. 2: With parallel injection, the internal inductance is protecting the source, so a minimum value of 20 μH is needed as specified in 5.4.9.2a.6. of ECSS-E-ST-20-07C Rev. 1
2.2 Turn on the measurement equipment and the TRITEL and wait until they are stabilized.
Qua./ EQM
-
Done.
-
N/A
3.1 Adjust the spike generator to a pulse duration.
Qua./ EQM
Report the pulse duration settings.
The test signal repetition was 3 s, the pulse number was 40, the pulse duration was ~10 µs.
-
N/A
3.2 Apply the test signal to the power leads and increase the generator output level to provide the specified voltage without exceeding the pulsed amplitude setting recorded during calibration.
Qua./ EQM
-
Done.
-
N/A
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
70/74
Date/Sign
07/10/2015
07/10/2015
07/10/2015
07/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
3.0
Spike transient conducted susceptibility measurement on the TRITEL power leads
Action 3.3 Apply repetitive (6 to 10 pulses per second) positive spikes to the TRITEL ungrounded power input lines for a period not less than 2 minutes in duration.
Level/ Model
Report
Check
Notes
Pass/Fail
Qua./ EQM
Report screenshot of the applied signal by oscilloscope.
See ANNEX I, Figures 65-68.
The following pulse parameters were available: repetition 3s, pulse number 40.
N/A
PASS
3.4 Monitor the TRITEL for degradation of performance.
Qua./ EQM
Only non-conformances shall be reported.
No performance degradation has been identified.
If susceptibility is noted, determine the threshold level in accordance with 5.2.10.3 of ECSS-EST-20-07C Rev. 1 and verify that it is above the specified requirements.
3.5 Repeat 3.3 with negative spikes, measure in case of 18V and 25V input voltage.
Qua./ EQM
Report screenshot of the test signal.
See ANNEX I, Figures 65-68.
-
N/A
No performance degradation has been identified.
If susceptibility is noted, determine the threshold level in accordance with 5.2.10.3 of ECSS-E-ST-2007C Rev. 1 and verify that it is above the specified requirements.
PASS
3.6 Monitor the TRITEL for degradation of performance.
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
Qua./ EQM
71/74
Only non-conformances shall be reported.
Date/Sign 07/10/2015
07/10/2015
07/10/2015
07/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT (CE, CS, INRUSH)
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
ESEO-TRITEL EMC Test (Test Plan ID: TEST_ESEO_TRITEL_011/A) ID
Activity
Action
Level/ Model
Report
Check
Notes
Pass/Fail
3.0
Spike transient conducted susceptibility measurement on the TRITEL power leads
3.7 Record the peak current as indicated on the oscilloscope.
Qua./ EQM
Report captured waveforms.
See ANNEX I, Figures 65-68.
-
N/A
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
72/74
Date/Sign 07/10/2015
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
TP Ref: TEST_ESEO_TRITEL_011/A
Centre for Energy Research, Hungarian Academy of Sciences ESEO-TRITEL Team
Doc. ID: MTA EK-SVL-2015-352-02-11A-00
10. Accept/reject criteria A test item will be considered as failed if it exhibits one or more of the above mentioned test steps given in the step-by-step procedure table, mainly: -
If ESEO-TRITEL’s differential mode conducted emission is over the predefined limit following ENV-EIDB-6140. o PASSED
-
If ESEO-TRITEL’s common mode conducted emission is over the predefined limit following ENV-EIDB-6145. o PASSED
-
If ESEO-TRITEL’s inrush current conducted emission is over the predefined limit following ENV-EIDB-6150. o PASSED
-
If ESEO-TRITEL’s differential mode conducted susceptibility is over the predefined limit following ENV-EIDB-6155. o PASSED
-
If ESEO-TRITEL’s common mode conducted susceptibility is over the predefined limit following ENV-EIDB-6160. o PASSED
-
If ESEO-TRITEL’s spike transient conducted susceptibility is over the predefined limit following ENV-EIDB-6165. o PASSED
The material is the intellectual property of the Centre for Energy Research, Hungarian Academy of Sciences. Unauthorized use is not permitted. File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
MTA EK SVL
Date: 15/10/2015
Issue/Rev: 0/0
Level: Qualification
Model: EQM
QUALIFICATION ESEO-TRITEL EMC TEST REPORT
TP Ref: TEST_ESEO_TRITEL_011/A Doc. ID: MTA EK-SVL-2015-352-02-11A-00
11. Test Report Sign-Off Sheet
ORGANIZATION
FUNCTION /NAME
MTA EK
Payload Developer / István Apáthy
15/10/2015
MTA EK
Project Supervisor / Balázs Zábori
15/10/2015
T-NETWORK
T-Network representative /Sándor Tatár
15/10/2015
MTA EK
University Coordinator / Attila Hirn
15/10/2015
File: EMC_test_report_ESEO_TRITEL_QUA_20151015_i0r0.docx
SIGNATURE
74/74
DATE
MTA EK SVL