X’PERT POWDER

Multipurpose diffraction for everyone

Your solution for powder analyses & more • State-of-the-art performance for an attractive price • Easy and economical upgrade path for now and the future

The Analytical X-ray Company

X’PERT POWDER

High throughput, high quality Equipped with a fullpower generator, a full-size goniometer using the Direct Optical Positioning (DOPS) system and the awardwinning X’Celerator detector, X’Pert Powder gives you unsurpassed price/data quality ratio in the mediumend XRD range.

X’Pert Powder advantages Full-power 3 kW generator gives you more intensity and fast results X’Celerator – the first solid-state line detector • Up to 100 times faster than standard Xe detectors • No compromise in resolution • Maintenance-free, no gas refill and return to factory needed • Largest installed base worldwide

Goniometer using Direct Optical Positioning (DOPS) • Sensors on goniometer arms, not on gears • Exceptional angular resolution

The PreFIX technology • Pre-aligned fast interchangeable X-ray modules • Single, conical bolt re-attachable optics to correct alignment position with few microns accuracy • Hardened tool steel components for life time precision • Easy configuration changes, without elaborate re-alignment • No compromise in resolution or intensity when switching between applications • Enjoy the latest developments on components in the optical path

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X’PERT POWDER

Your solution for powder analyses and more The latest addition to the X’Pert PRO family of X-ray diffractometers, X’Pert Powder offers highthroughput and high-quality phase identification and quantification of polycrystalline materials for an attractive price. As pioneer in modular system building, PANalytical’s X’Pert Powder can be easily upgraded now or in the future as new applications arise.

Versatile, yet easy to use For powder analyses, phase analysis, quantification With limited additional investment you can: • Perform analyses on thin films • Perform particle sizing on nanomaterials • Investigate the influence of temperature on material properties • Perform automated analyses on multiple samples • Benefit from the latest developments on optics, sample stages, detectors, X-ray tubes and analysis software

State-of-the-art performance for an attractive price • High-speed, high-quality data acquisition • Up to five times faster than a benchtop system • Comprehensive and easy-to-use software • Over 10 years of proven quality • Community of over 2500 user sites

Almost 80% of the world’s top 50 universities* are customers and development partners of PANalytical. *www.usnews.com/articles/education/worlds-bestuniversities/2009/10/20/worlds-best-universities-top-200. html

X’PERT POWDER

For phase analysis and quantification Determine the crystal structure of your sample using HighScore (Plus). Whether you want to have full control using the latest analysis techniques or you want to let HighScore automatically process your analysis using an automatic sample changer, you can configure HighScore to your needs.

Semi-quantitative analysis by RIR Reference intensity ratio method utilizes RIR data from ICDD cards to provide an estimate of mixture composition.

For transmission An X’Pert Powder is easily converted to transmission geometry, resulting in more accurate peak positions and intensities at low angles. The same geometry can also be used for SAXS and for powders in glass capillaries.

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You can identify your sample by comparing it with reference patterns. With HighScore you have free choice of reference databases. You can use the ICDD, PAN-ICSD or free databases available on the internet (e.g. Crystallography Open Database). With this free choice of reference databases you have access to 100,000 to 500,000 reference patterns of different quality. For push-button quantification of your samples you can use X’Pert Quantify or X’Pert Industry. In case you have complex samples with many phases we offer extensive application support.

Reflection geometry Transmission geometry

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Comparison of diffractograms of milk chocolate in reflection and transmission mode. The latter shows much better low-angle performance.

X’PERT POWDER

You can easily reconfigure X’Pert Powder for your thin film analyses. With X-ray reflectometry you can measure the thickness and quality of the layers of your thin film structure, resulting from density differences between the layers. Alternatively you can identify the phases of individual layers in your thin film structure using grazing incidence optics. With the resulting geometry you reduce the penetration depth of the X-rays, yielding information of only the top layer(s) depending on the angle of incidence.

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Example of reflectometry measurement on 40 nm polystyrene film on an oxidized Si substrate

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There is more than just Bragg peaks in a diffractogram... At small angles X-rays scatter with nano-sized structures - small-angle X-ray scattering (SAXS) is an ideal way to characterize these structures. Unlike electron microscopy, SAXS is a very fast method to measure nano-sized structures that yields representative structural information over a macroscopic volume of your sample. Your X’Pert Powder can be converted into a SAXS instrument. Using the EasySAXS software you can analyze nano-sized particles, nano-sized composites and nano-sized pores.

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65Å Example of particle size distribution of a mixture of nanopowder of anatase and rutile, derived from small angle measurements

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PANalytical software - your added value PANalytical’s software range gives X-ray diffraction instruments a common platform for data collection and analysis. Users can choose from a wide range of modules that collect and analyze data for R&D and process control. Measurement results are interchangeable with other systems using the open XRDML format for data transfer and file sharing, based on the industry and internet standard XML.

1. Data Collector for instrument control and data acquisition for all XRD applications 2. Data stored in open format XRDML 3. Use HighScore (Plus), Reflectivity or EasySAXS to analyze your data

From data acquisition all the way to data analysis of your experiment, PANalytical’s software helps you to draw the right conclusions. PANalytical’s Data Collector is a universal data acquisition software package for all XRD applications. Whether you want to perform phase analysis on powders, analyze nanoparticles or analyze your thin film structure, Data Collector provides you with an ease way to set up your experiment. Data are stored in the open XRDML platform and contain all information to repeat your measurement. XRDML files can easily be previewed and organized using PANalytical’s Explorer add-ons. For the different applications data in the XRDML file can be analyzed with HighScore, Reflectivity or EasySAXS. You can automatically start your analysis with Data Collector using the Automatic Processing Program.

Getting the maximum out of your data PANalytical facilities around the world deliver training courses, instrument familiarization sessions, applications workshops and remote learning channels to provide important information for new and existing customers, alongside with more general scientific meetings on a variety of X-ray diffraction and scattering topics.

PANalytical expertise • Extensive user documentation to help you to get the most out of your investment - User’s guide - Quick Start guides - Software help - Tutorials • Courses tailored to your needs around the globe - Basic XRD course - Crystallography - Non-ambient analysis - HighScore - Small-angle X-ray scattering - Reflectometry

What is X-ray diffraction? unknown sample with an internationally recognized database containing reference patterns for more than 200,000 phases. Modern computer-controlled diffractometer systems use automatic routines to measure, record and interpret the unique diffractograms produced by individual constituents in even highly complex mixtures.

The sample The diagram depicts a typical sample, comprising two crystalline phases (violet, blue), each with different average crystallite sizes, plus a proportion of amorphous material (beige). The features of the diffractogram shown below are color-coded to indicate the relevant components.

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The result The result of an XRD measurement is a diffractogram, showing crystalline phases present (peak positions), phase concentrations (peak areas), amorphous content (background hump) and crystallite size/strain (peak widths).

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PANalytical B.V. Lelyweg 1, 7602 EA Almelo P.O. Box 13, 7600 AA Almelo The Netherlands T +31 (0) 546 534 444 F +31 (0) 546 534 598 [email protected] www.panalytical.com Regional sales offices Americas T +1 508 647 1100 F +1 508 647 1115 Europe, Middle East, Africa T +31 (0) 546 834 444 F +31 (0) 546 834 499

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Asia Pacific T +65 6741 2868 F +65 6741 2166

Although diligent care has been used to ensure that the information herein is accurate, nothing contained herein can be construed to imply any representation or warranty as to the accuracy, currency or completeness of this information. The content hereof is subject to change without further notice. Please contact us for the latest version of this document or further information. © PANalytical B.V. 2009. 9498 702 18711 PN7654

The method X-ray diffraction is a versatile, nondestructive analytical technique for identification and quantitative determination of the various crystalline forms, known as ‘phases‘, of compounds present in powdered and solid samples. Identification is achieved by comparing the X-ray diffraction pattern - or ‘diffractogram‘ - obtained from an