23rd Annual Workshop on Secondary Ion Mass Spectrometry and Related Techniques Monday - May 16, 2011 12:00- 6:00 PM Vendor Exhibitor Setup 12:00 – 6:00 PM Registration/ Instrument Users Schools (TBD)- Confirm attendance. Help find meeting space 6:00- PM Opening Reception
Tentative Agenda 4-25-2011 Subject to Change without Notice
23rd Annual Workshop on Secondary Ion Mass Spectrometry and Related Techniques ---------------------------------------------------------------------------------------------------------------------------------
Monday - May 17, 2011 1:00 - 6:00 PM
Vendor Exhibitor Setup
1:00 - 5:00 PM
Instrument Users Schools
ION-TOF Users Meeting/School (location TBD) Physical Electronics Users Meeting/School (location TBD) Cameca Users Meeting (Not yet confirmed) 6:00 - 9:00 PM
Welcome Reception / Conference Registration
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Tuesday - May 17, 2011 Tutorial Presentations – Fundamentals and Instrumentation for Surface Analysis 7:30 - 8:00 AM
Continental Breakfast/Conference Registration
8:00 - 8:15 AM
Welcome and Introductions
8:15 - 9:00 AM
Secondary Ion Formation Mechanisms in SIMS, Peter Williams, Arizona State University
9:00 - 9:45 AM
Molecular Dynamics Simulations, the Theoretical Partner to SIMS, Barbara Garrison, Pennsylvania State University
9:45 - 10:05 AM
Break
10:05 - 10:50 AM
Fundamentals and Limitations of Detection Systems used for SIMS and Mass Spectrometry, David Simons, NIST
10:50 - 11:35 AM
Introduction to Vacuum Technology, Fred Stevie, North Carolina State University
11:35 - 12:20 PM
The Basics of SIMS Ion Source Design and Performance, Noel Smith, Oregon Physics, LLC
12:20 - 1:20 PM
Lunch
Forensic and Novel Applications of SIMS 1:20 - 1:40 PM
TOF-SIMS of Fingerprints, Małgorzata Iwona Szynkowska, Technical University of Lodz, Poland
1:40 - 2:00 PM
The Role of SIMS in Nuclear Forensics, Michael J. Kristo, Lawrence Livermore National Laboratory
2.00 - 2:20 PM
Uranium Isotope Measurements for Nuclear Safeguards, John Cliff, University of Western Australia
2:20 - 2:40 PM
Investigating the Surface Chemistry of Engineered Nanoparticles by SIMS, Christopher Szakal, NIST
2:40 - 3:00 PM
TOF SIMS of Inks, Nathan Havercroft, ION-TOF USA
3:00 - 3:20 PM
Distinguishing Wood Biopolymers by ToF-SIMS Robyn Goacher, University of Toronto, Canada
3:20 - 3:50 PM
An Affordable, High Spatial Resolution FIB-TOF SIMS Instrument, J. A. Whitby, EMPA, Thun, Switzerland
3:50 - 4:10 PM
Break
Data Analysis for SIMS 4:10 - 4:30 PM
Informatics for Identification from SIMS Spectra: Opportunities, Methods and Technology Requirements, Ian Gilmore, National Physical Laboratory, UK
4:30 - 4:50 PM
Automated Classification of SIMS Images, Andy Konicek, NIST
4:50 - 5:10 PM
Tools for TOF-SIMS Data Analysis, Dan Graham, University of Washington
Poster Session 5:00 - 7:00 PM
Poster Viewing/Reception
7:00 - Open for Vendor User Meetings, Breakout Meetings as Needed ---------------------------------------------------------------------------------------------------------------------------------
Wednesday – May 18, 2011 Technical Program 7:30 - 8:00 AM
Continental Breakfast
Next Generation Cluster Ion Sources (Greg Gillen and Jiro Matsuo) 8:00 - 8:20 AM
Clusters for Organic Mass Spectrometry: From Small and Hard to Huge and Soft, Arnaud Delcorte, Université Catholique de Louvain, Belgium
8:20 - 8:40 AM
Giant Gas Cluster Ions – Primary Ion Beams for SIMS , John Vickerman, University of Manchester, UK
8:40 - 9:00 AM
Massive Gaseous Cluster Ion Sources, Jiro Matsuo, Kyoto University, Japan
9:00 - 9:20 AM
Surface Analysis by Electrospray Droplet Impact/SIMS, Kenzo Hiraoka, University of Yamanashi, Japan
9:20 - 9:40 AM
Gold Cluster Ion Sources, Emile Schweikert, Texas A&M University
9:40 - 10:00 AM
Break
Biological and Medical Applications of Dynamic and ToF SIMS Part I (Peter Williams and Nicholas Winograd) 10:00 - 10:20 AM
Potential Impact of Nano SIMS in Biological Research, Peter Williams, Arizona State University
10:20 - 10:40 AM
Surface Analysis of Protein Patterns and Gradients, Thomas Beebe, University of Delaware
10:40 - 11:00 AM
Subcellular SIMS Imaging of Therapeutic Drugs in Neutron Capture Therapy of Brain Cancer, Subhash Chandra, Cornell University
11:00 - 11:20 AM
Prospects of Biological Analysis by ToF SIMS, John Vickerman, University of Manchester, UK
11:20 - 11:40 PM
Nano SIMS Talk, Claude Lechene, Brigham & Women’s Hospital
11:40 - 12:00 PM
Tracking Trace Element Sequestration Mechanisms by High Resolution SIMS Analysis in Rice and Wheat Roots and Grain, Christopher Grovenor, Oxford University, UK
12:00 - 12:20 PM
Differences in Nitrate Usage by Coexisting Sulfate-reducing Bacteria Associated with Anaerobic Methane-oxidizing Archaea, Abigail Green, Anne Dekas, and Victoria Orphan, California Institute of Technology
12:20 - 1:20 PM
Lunch
Special Topical Session - New Developments in Atom Probe Tomography (Ian M. Anderson) 1:20 - 1:40 PM
Atom Probe Tomography (APT): An Overview for the SIMS Community, Tom Kelly, Cameca Instruments
1:40 - 2:00 PM
Applications of APT to Structural Alloys and Ceramics, Emmanuelle Marquis, University of Michigan
2:00 - 2:20 PM
Atom Probe Applications to Electronic Materials, Brian Gorman, Colorado School of Mines
2:20 - 2:40 PM
Atom Probe Tomography Studies of Thin Films, Karen Henry, NIST
2:40 - 3:00 PM
Break
Quantitative Analysis/ Depth Profiling for SIMS and Surface Analysis 3:00 - 3:20 PM
Use of Inkjet Printing Standards for SIMS and APIMS Elemental and Molecular Useful Yields and Quantification, Greg Gillen, NIST
3:20 - 3:40 PM
SIMS Analysis of Niobium Bicrystals, Prateek Maheshwari, North Carolina State University
3:40 - 4:00 PM
Extremely Low Energy Dynamic SIMS Depth Profiling in Organic Materials Based Structures and High Dosed Shallow Solid State Semiconductors, Alex Merkulov, Cameca Instruments, France
Workshop Sponsor Session (Fred Stevie) 4:00 - 4:20 PM
Recent Developments in TOF SIMS at PHI, Scott Bryan, Physical Electronics
4:20 - 4:40 PM
Cameca Instruments, France
4:40 - 5:00 PM
Recent Developments in TOF SIMS at Ion TOF, Ewald Niehuis, ION TOF GmbH, Munster, Germany
SIMS ASTM Committee Meeting 5:00 - 5:20 PM
ASTM Meeting/Workshop - (Chair: Tim Brewer)
Conference Banquet Walk to Baltimore Inner Harbor 6:15 7:00 - 10:00 PM
Conference Dinner Inner Harbor-Chesapeake Bay
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Thursday - May 19, 2011 Technical Program 7:00 - 8:00 AM
Continental Breakfast
Molecular Depth Profiling/Organic Surface Analysis/Cluster Bombardment 8:00 - 8:20 AM
Emission of Neutral and Ionized SinCm Clusters During C60 Bombardment of Silicon, Andreas Wucher, Faculty of Physics, University of Duisburg-Essen, Germany
8:20 - 8:40 AM
Dual Beam Depth Profiling of Organic Materials Using an Ar Cluster Ion Beam for Sputtering, R. Moellers, ION-TOF GmbH, Germany
8:40 - 9:00 AM
The Evolution of FIB-TOF for Organic 3D Imaging, Greg Fisher, Physical Electronics Inc.
9:00 - 9:20 AM
Does Low Temperature Depth Profiling Reduce Ion Suppression Effects for Amino Acids? Alan Piwowar, Pennsylvania State University
9:20 - 9:40 AM
New Developments in Matrix Enhanced SIMS Using Room Temperature Ionic Liquids, Jennifer J.D. Fitzgerald, University of Texas at Dallas
9:40 - 9:55 AM
Break
Special Invited Symposium - Ambient Ionization Mass Spectrometry (R. Graham Cooks) 9:55 - 10:20 AM
Ambient Ionization: Spray Methods for Tissue Imaging, Disease Diagnostics, Food & Public Safety, R. Graham Cooks, Purdue University
10:20 - 10:45 AM
In vivo Shotgun Lipidomics by Ambient Mass Spectrometry, Zoltan Takats, Justus-Liebig-University, Germany
10:45 - 11:10 AM
Non-resonant, Femtosecond Laser Vaporization Mass Spectrometry: Measuring Protein Conformation Directly from Condensed Phase Samples, Robert Levis, Temple University
11:10 - 11:20 AM
Discussion Period
11:20 - 11:45 AM
Performing Electrospray Laser Desorption Ionization and Desorption Electrospray Ionization Mass Spectrometric Analyses Using Rotating Electrosprayers, Jantaie Shiea, National Sun Yat Sen University, Taiwan
11:45 - 12:10 PM
From Tissues to Cells and Beyond with Laser Ablation Electrospray Ionization (LAESI) Mass Spectrometry, Akos Vertes, George Washington University
12:10 - 12:35 PM
Liquid Extraction Based Surface Sampling Probe, Marian Einaggar, Oak Ridge National Laboratory
12:35 - 1:35 PM
Lunch
1:35 - 2:00 PM 2:00 - 2:25 PM
Surface Analysis by Ambient Mass Spectrometry: Practical Applications for Industry, Nari Talaty, Abbott Laboratories
2:25 - 2:50 PM
Ambient Ionization for Surface Analysis, Felicia Green, National Physical Laboratory, UK
2:50 - 3:00 PM
Discussion Period
3:00 - 3:25 PM
DESI Imaging in Oncology, Justin Wiseman, Prosolia Inc.
3:25 - 3:50 PM
Direct Analysis in Real Time: DART®, Chip Cody, JEOL USA
3:50 - 4:15 PM
Low-temperature Plasma Ionization Using Miniature Probes: Performance and Applications, Jon Dalgleish, Purdue University
4:15 - 4:40 PM
Advances in Ambient Imaging Mass Spectrometry of Natural Marine Products, Facundo Fernandez, Georgia Institute of Technology
4:40 - 5:05 PM
Coupling Mass Spectrometry with Chromatography and Electrochemistry by Desorption Electrospray Ionization, Hao Chen, Ohio University
5:05 - 5:30 PM
Atmospheric Desorption and Detection of Organic Compounds by Atmospheric Pressure Glow Discharge MS (APGD-MS), Tim Brewer, NIST (contributed)
5:30 - 6:00 PM
Discussion Period
Conference Dinner and Vendor Presentations 6:00 - 8:00 PM
Dinner provided with short presentations on latest developments from participating vendors
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Friday – May 20, 2011
Technical Program 7:30 - 8:30 AM
Continental Breakfast
Biological and Medical Applications of Dynamic and ToF SIMSPart II (Subhash Chandra and John Vickerman) 8:30 - 8:50 AM
Biological Applications of ToF SIMS, Nicholas Winograd, Penn State University
8:50 - 9:10 AM
High-resolution SIMS Imaging of Lipid Distribution in the Plasma Membrane, Mary Kraft, University of Illinois at Urbana-Champaign
9:10 - 9:30 AM
Probing Molecular Distributions within Neurons, Jonathan V. Sweedler, University of Illinois at Urbana-Champaign
9:30 - 9:50 AM
NanoSIMS and Microbial Ecology: Linking Microbial Function to Identity at the Single Cell Scale, Jennifer Pett-Ridge, Lawrence Livermore National Laboratory
9:50 - 10:10 AM
Characterizing the orientation of immobilized proteins with ToF-SIMS, David Castner, University of Washington
10:10 - 10:30 AM
Analysis of Bacterial Biofilms & Polyelectrolyte Multilayer Models by Laser Desorption Postionization & SIMS, Luke Hanley, University of Chicago
10:30 - 10:50 AM
Break
10:50 -11:10 AM
3D Molecular Imaging of Drug Delivery Systems, Christine Mahoney, NIST
11:50 - 11:30 AM
Chemical and Spatial Differentiation of Syringyl and Guaiacyl Monolignols in Poplar Wood via TOF SIMS, Chuanzhen Zhou, North Carolina State University
11:30 - 11:50 AM
Enhanced Molecular Ion Emission using a 100KV Massive Gold Cluster Source from Native Biological Surfaces, Francisco Fernandez, Texas A&M University
11:50 - AM
Closing Remarks
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POSTER SESSION – Tuesday, May 17, 2011 (5:00 - 7:00 PM)
1. Understanding Bond Failure in Multilayer Systems using Surface Analysis and
Microscopy, Michaeleen Pacholski, Dow Chemical Company 2. Dynamic C60+ SIMS for Single Organic Particle Characterization L.T. Demoranville, NIST 3. Laser Diode Thermal Desorption/Atmospheric Pressure Chemical Ionization Tandem Mass Spectrometry Analysis of Inkjet Printed Trace Explosive Test Materials, Eric Windsor, NIST 4. Evaluation of Standards for Silicon Analysis in Germanium Genesis Collectors by SIMS-AMS. C. Cetina, L.T. Demoranville, K.S. Grabowski, and D.L. Knies, Naval Research Laboratory 5. APIMS of Narcotics, Timothy Brewer, NIST 6. Comparison of TOF and Magnetic Sector SIMS for Dopant Profiling, Micron Technology 7. Extraction of Depth Profiles from Steady State MD Simulations, R. Paruch, B. J. Garrison and Z. Postawa, Pennsylvania State University 8. Compositional Mapping of the Surface and Interior of Mammalian Cells at Submicrometer Resolution., Christopher Szakal, NIST 9. DESI-MS and ESI-MS of Explosives, Christopher Szakal, NIST 10. Molecular Dynamics Simulations to Explore the Effects of Si-C Chemistry in Multi-Impact Bombardment of Silicon by 20 keV C60 Projectiles, Kristen Kranztman, College of Charleston 11. MD Investigation of Chemical Damage in Benzene Induced by 15 keV C60 Cluster Bombardment, Paul Kennedy, Pennsylvania State University
12. Analysis of Biologically Relevant Samples Using TOF-SIMS and PCA: From Supported Lipid Membranes to Extracellular Matrix Proteins, Chris Anderton, NIST 13. Room Temperature Redistributions of Impurities in Electroplated Copper Films by TOF-SIMS and FIB, S. W. Novak, University at Albany 14. Andromeda and END-MS, New Generation of Surface Analysis Instrument Serge Della-Negra, Institut de Physique Nucléaire d’Orsay, France 15. Mapping the Cellular Distribution of a Gold-based Anticancer Compound: Studies using NanoSIMS and EFTEM, John Cliff, University of Western Australia 16. SIMS Characterization of Bonded Wafers, Joe Bennett, SVTC Technologies LLC 17. Recent Developments in Helium Ion Microscopy, S.J. Sijbrandij, Carl Zeiss 18. Extraction of depth profiles from steady-state MD simulations, R. Paruch, Department of Chemistry, Penn State University 19. Molecular Depth Profiling and Dynamic Imaging of Liposomes, Caiyan Lu, Department of Chemistry, Penn State University 20. Molecular Depth Profiling by Wedged Crater Bevelling, Dan Mao, Department of Chemistry, Penn State University 21. The Design and Assembly of a C60+ Q-TOF SIMS/MALDI Hybrid Instrument, Eric J. Lanni, Department of Chemistry, University of Illinois 22. Study of electron emission from single cluster impacts, M.J. Eller, Department of Chemistry, Texas, A&M University 23. Molecular Dynamics Investigation of Chemical Damage in an Organic Solid Induced by 15 keV C60 Cluster Bombardment, Paul Kennedy, Department of Chemistry, Penn State University 24. Nanoparticle Impacts on Nanometic Carbon Foils: Impact and Exit Side Ion Emission, J. DeBord, Texas A&M University 25. 3D Characterization of Drug Delivery Systems by Cluster SIMS, Christine Mahoney, NIST 26. Towards ambient pressure SIMS using MeV monomer primary ions B. N. Jones., Surrey Ion Beam Centre, University of Surrey, United Kingdom
27. High dynamic range isotope ratio measurements using an analog electron multiplier, Peter Williams, Department of Chemistry, Arizona State University 28. TOF SIMS Study of Lithium Transport in the Solid Electrolyte Interphase, Peng Lu, General Motors Technical Center, Warren, MI 29. Rapid micronutrient detection utilizing low-temperature plasma pencil mass spectrometry, Edward Lo, University of Washington,
