SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

EMC TEST REPORT REPORT NO.:ECE1011114R MODEL : YCM-550, YCM-550C, SW-550, SW-560, SW-550C, SW-560C, SW-510, SW-510C, SW-30M, SW-100, SW-130, YCM-560, YCM-560C, YR-516, YCM-515, YCM-512, YC-807, YR-510, YR-510C, YR-520, YR-520C, YC-809, YC-807, YC-301, YR-801, YR-803, YCM-20, YCM-25, YCM-30, YCM-40, YCM-45, YCM-532, YCM-622, YCM-622C, YCM-501, YCM-502, YCM-513, YCM-513C, YCM-525, YR300, YR-600, YR-680, SW-600, SW-680

RECEIVED: Nov. 17, 2010 TESTED: Nov. 18, 2010 to Dec. 01, 2010

APPLICANT: Shenzhen LSVT Co., Ltd. ADDRESS: 5th Floor, 2nd Block, Zhongyuntai Industrial Park, No. 1 Road, Tangtou, Shiyan Street, Bao’an District, Shenzhen City

ISSUED BY: Shenzhen SETEK Technology Co., Ltd. LAB LOCATION: 1003, C Bldg, Fuyuan Business Trade Center, 44 District Bao’an, Shenzhen, China

This test report consists of 32 pages in total, it may be duplicated completely for legal use with the approval of the applicant, It should not be reproduced except in full, without the written approval of our laboratory, The test results in the report only apply to the tested sample. SHENZHEN SETEK TECHNOLOGY CO., LTD. Our website: www.setek.com.cn E-mail: [email protected] TEL:86-755-26966362 FAX: 86-755-26966270

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Prepared for

: Shenzhen LSVT Co., Ltd.

Address

: 5th Floor, 2nd Block, Zhongyuntai Industrial Park, No. 1 Road, Tangtou, Shiyan Street, Bao’an District, Shenzhen City

Product

: Color Dome Camera

Model

: YCM-550, YCM-550C, SW-550, SW-560, SW-550C, SW-560C, SW-510, SW-510C, SW-30M, SW-100, SW-130, YCM-560, YCM-560C, YR-516, YCM-515, YCM-512, YC-807, YR-510, YR-510C, YR-520, YR-520C, YC-809, YC-807, YC-301, YR-801, YR-803, YCM-20, YCM-25, YCM-30, YCM-40, YCM-45, YCM-532, YCM-622, YCM-622C, YCM-501, YCM-502, YCM-513, YCM-513C, YCM-525, YR300, YR-600, YR-680, SW-600, SW-680

Trademark

: N/A

Test Standard

: EN 50130-4: 1995+A1: 1998+A2: 2003 (EN61000-4-2: 2009, EN61000-4-3: 2006, EN61000-4-4: 2006+A1:2009, EN61000-4-5: 2006, EN61000-4-6: 2009, EN 61000-4-11:2004)

Prepared by

: Shenzhen SETEK Technology Co., Ltd.

Address

: 1003, C Bldg, Fuyuan Business Trade Center, 44 District Bao’an, Shenzhen, China Tel: (86-755) 26966362

Prepared by

Fax:(86-755) 26966270

: (Engineer)

Reviewer by

:

(Project Engineer) Approved by

: (Manager)

Report Number Date of Test Date of Report

: ECE1011114R : Nov. 18, 2010 to Dec. 01, 2010 : Dec. 02, 2010

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 2 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

TABLE OF CONTENT Description Page Test Report Description 1.

GENERAL INFORMATION ..........................................................................................................................5 1.1. Description of Device (EUT) .......................................................................................................................... 5 1.2. Description of Support Device ....................................................................................................................... 6 1.3. Test Standards ................................................................................................................................................. 6 1.4. Measurement Uncertainty ............................................................................................................................. 6

2.

MEASURING DEVICE AND TEST EQUIPMENT .....................................................................................7 2.1. For Power Line Conducted Emission............................................................................................................ 7 2.2. For Radiated Emission Measurement........................................................................................................... 7 2.3. For Harmonic Current / Flicker Measurement ........................................................................................... 7 2.4. For Electrostatic Discharge Immunity Test ................................................................................................. 7 2.5. For RF Strength Susceptibility Test .............................................................................................................. 8 2.6. For Electrical Fast Transient /Burst Immunity Test ................................................................................... 8 2.7. For Surge Immunity Test............................................................................................................................... 8 2.8. For Injected Current Susceptibility Test ...................................................................................................... 8 2.9. For Magnetic Field Immunity Test ............................................................................................................... 8 2.10. For Voltage Dips and Interruptions Test .................................................................................................... 9

3. ELECTROSTATIC DISCHARGE IMMUNITY TEST .................................................................................10 3.1 Block Diagram of Test Setup........................................................................................................................ 10 3.2 Test Standard................................................................................................................................................. 10 3.3 Severity Levels and Performance Criterion............................................................................................. 10 3.4 EUT Configuration .................................................................................................................................... 11 3.5 Operating Condition of EUT..................................................................................................................... 11 3.6 Test Procedure ............................................................................................................................................... 11 3.7 Test Results .................................................................................................................................................... 11 4.

RF FIELD STRENGTH SUSCEPTIBILITY TEST ...................................................................................13 4.1 Block Diagram of Test .................................................................................................................................. 13 4.2 Test Standard ................................................................................................................................................. 13 4.3 Severity Levels and Performance Criterion................................................................................................ 14 4.4 EUT Configuration on Test .......................................................................................................................... 14 4.5 Operating Condition of EUT........................................................................................................................ 14 4.6 Test Procedure ............................................................................................................................................... 14 Test Results ........................................................................................................................................................... 14

5. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST.................................................................16 5.1 Block Diagram of Test Setup ........................................................................................................................ 16 5.2 Test Standard ................................................................................................................................................. 16 5.3 Severity Levels and Performance Criterion................................................................................................ 16 5.4 EUT Configuration ....................................................................................................................................... 16 5.5 Operating Condition of EUT........................................................................................................................ 17 5.6 Test Procedure ............................................................................................................................................... 17 5.7 Test Result ...................................................................................................................................................... 17 6. SURGE IMMUNITY TEST...............................................................................................................................19 6.1 Block Diagram of Test Setup ........................................................................................................................ 19 6.2 Test Standard ................................................................................................................................................. 19 6.3 Severity Levels and Performance Criterion................................................................................................ 19 6.4 EUT Configuration ....................................................................................................................................... 20 6.5 Operating Condition of EUT........................................................................................................................ 20 6.6 Test Procedure ............................................................................................................................................... 20 The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 3 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

6.7 Test Result ...................................................................................................................................................... 20 7. INJECTED CURRENTS SUSCEPTIBILITY TEST......................................................................................22 7.1 Block Diagram of Test Setup ........................................................................................................................ 22 7.2 Test Standard ................................................................................................................................................. 22 7.3 Severity Levels and Performance Criterion................................................................................................ 22 7.4 EUT Configuration ....................................................................................................................................... 23 7.5 Operating Condition of EUT ....................................................................................................................... 23 7.6 Test Procedure ............................................................................................................................................... 23 7.7 Test Results .................................................................................................................................................... 23 8. VOLTAGE DIPS AND INTERRUPTIONS TEST ..........................................................................................25 8.1 Block Diagram of Test Setup ........................................................................................................................ 25 8.2 Test Standard ................................................................................................................................................. 25 8.3 Severity Levels and Performance Criterion................................................................................................ 26 8.4 EUT Configuration ....................................................................................................................................... 26 8.5 Operating Condition of EUT........................................................................................................................ 26 8.6 Test Procedure ............................................................................................................................................... 26 8.7 Test Result ...................................................................................................................................................... 26

APPENDIX I

(Photos of EUT)

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 4 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

1. GENERAL INFORMATION 1.1.Description of Device (EUT) EUT

:

Color Dome Camera

Model

:

YCM-550, YCM-550C, SW-550, SW-560, SW-550C, SW-560C, SW-510, SW-510C, SW-30M, SW-100, SW-130, YCM-560, YCM-560C, YR-516, YCM-515, YCM-512, YC-807, YR-510, YR-510C, YR-520, YR-520C, YC-809, YC-807, YC-301, YR-801, YR-803, YCM-20, YCM-25, YCM-30, YCM-40, YCM-45, YCM-532, YCM-622, YCM-622C, YCM-501, YCM-502, YCM-513, YCM-513C, YCM-525, YR300, YR-600, YR-680, SW-600, SW-680 The applicant models are all identical in interior structure, electrical circuits and components, and just the model names are different for the marketing requirement. We prepare YCM-550 for EMC test.

Power Supply of EUT

:

DC 12V / AC 24V

Applicant

:

Shenzhen LSVT Co., Ltd.

Address

:

5th Floor, 2nd Block, Zhongyuntai Industrial Park, No. 1 Road, Tangtou, Shiyan Street, Bao’an District, Shenzhen City

Manufacturer

:

Shenzhen LSVT Co., Ltd.

Address

:

5th Floor, 2nd Block, Zhongyuntai Industrial Park, No. 1 Road, Tangtou, Shiyan Street, Bao’an District, Shenzhen City

Date of receiver

:

Nov. 17, 2010

Date of Test

:

Nov. 18, 2010 to Dec. 01, 2010

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 5 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

1.2. Description of Support Device PC

: Manufacturer: DELL M/N: E157FPc S/N: 53SM12X CCC,FCC,VCCI,GS,S,CE : Manufacturer: SAMSUNG M/N: 710MP [R]S S/N: MH17HVY500468F CCC,SA,UL : Manufacturer: DELL M/N: M056UOA S/N: F1101WOS CE, VCCI,FCC,GS,UL : Manufacturer: DELL M/N: SK-8135 S/N: CN-0DJ340-71616683-01U6 VCCI,CE, FCC : Manufacturer: SAMSUNG M/N: ML-1610 S/N:BKAYB04125 CCC,CE,UL

Monitor

Mouse

Keyboard

Printer

1.3. Test Standards Test Standards EN 50130-4: 1995+A1: 1998+A2: 2003

Alarm systems -- Part 4: Electromagnetic compatibility - Product family standard: Immunity requirements for components of fire, intruder and social alarm systems

/ / /

/ / /

1.4. Measurement Uncertainty Radiation Uncertainty

: Ur = ± 3.84dB

Conduction Uncertainty

: Uc = ± 2.72dB

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 6 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

2. MEASURING DEVICE AND TEST EQUIPMENT 2.1.For Power Line Conducted Emission Item Equipment 1. Test Receiver 2. L.I.S.N 3. 50ΩCoaxial Switch 4. Pulse Limiter 5. Voltage Probe

Manufacturer Rohde & Schwarz Rohde & Schwarz Anritsu

Model No. Serial No. Last Cal. Cal. Interval ESCS30 828985/018 May 27, 2010 1 Year ESH2-Z5 834549/005 May 27, 2010 1 Year MP59B M20531 N/A N/A

Rohde & Schwarz Rohde & Schwarz

ESH3-Z2 TK9416

100006 N/A

May 27, 2010 1 Year May 27, 2010 1 Year

2.2.For Radiated Emission Measurement Item Equipment 1. Spectrum Analyzer 2. Test Receiver

Manufacturer ANRITSU Rohde & Schwarz 3. Bilog Antenna Schwarzbeck 4. 50 Coaxial Switch Anritsu Corp 5. EMI Power Line Filter DUOJI EME 6. EMI Power Line Filter JIANLI 7. Cable Schwarzbeck 8. Cable Rosenberger 9. Cable Schwarzbeck 10. Cable Schwarzbeck 11. Signal Generator HP

Model No. MS2661C ESCS30

Serial No. 6200140915 828985/018

Last Cal. Cal. Interval May 27, 2010 1 Year May 27, 2010 1 Year

VULB9163 MP59B FNF 201 B16 DL-40C AK9513 N/A AK9513 AK9513 8648A

142 6100237248 N/A N/A ACRX1 FP2RX2 CRPX1 CRRX2 3625U00573

May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010 May 27, 2010

1 Year 1 Year 1 Year 1 Year 1 Year 1 Year 1 Year 1 Year 1 Year

2.3.For Harmonic Current / Flicker Measurement Item 1. 2.

Equipment Power Frequency Test System PC

Manufacturer HAEFELY

Model No. PHF555

Serial No. 080419-03

N/A

P2L97

N/A

Last Cal. Cal. Interval May 27, 2010 1 Year May 27, 2010

N/A

2.4. For Electrostatic Discharge Immunity Test Item 1.

Equipment ESD Tester

Manufacturer Model No. HAEFELY PESD1600

Serial No. H708159

Last Cal. Cal. Interval May 27, 2010 1 Year

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 7 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

2.5. For RF Strength Susceptibility Test Item 1. 2. 3. 4. 5. 6. 7. 8.

Equipment Manufacturer Model No. Serial No. Last Cal. Cal. Interval Signal Generator HP 8648A 3625U00573 May 27, 2010 1 Year Amplifier AR 500A100 17034 NCR NCR Amplifier AR 100W/1000M1 17028 NCR NCR Isotropic Field AR FM2000 16829 NCR NCR Monitor Isotropic Field Probe AR FP2000 16755 May 27, 2010 1 Year Biconic Antenna EMCO 3108 9507-2534 NCR NCR Log-periodic AR AT1080 16812 NCR NCR Antenna PC N/A 486DX2 N/A N/A N/A

2.6. For Electrical Fast Transient /Burst Immunity Test Item 1. 2.

Equipment Burst Tester Coupling Clamp

Manufacturer Model No. Serial No. HAEFELY PEFT4010 080981-16 HAEFELY IP-4A 147147

Last Cal. May 27, 2010 May 27, 2010

Cal. Interval 1Year 1Year

2.7. For Surge Immunity Test Item 1.

Equipment Surge Tester

Manufacturer Model No. Serial No. Last Cal. Cal. Interval HAEFELY PSURGE4.1 080107-04 May 27, 2010 1Year

2.8. For Injected Current Susceptibility Test Item 1. 2. 3. 4.

Equipment Simulator CDN CDN Injection Clamp

Manufacturer EMTEST EMTEST EMTEST EMTEST

5.

Attenuator

EMTEST

Model No. Serial No. Last Cal. Cal. Interval CWS500C 0900-12 May 27, 2010 1Year CDN-M2 5100100100 May 27, 2010 1Year CDN-M3 0900-11 May 27, 2010 1Year F-2031-23 368 May 27, 2010 1Year MM ATT6 0010222A May 27, 2010 1Year

2.9. For Magnetic Field Immunity Test Item Equipment Manufacturer 1. Magnetic Field HAEFELY Tester

Model No. MAG100

Serial No. Last Cal. Cal. Interval 250040.1 May 27, 2010 1Year

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 8 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

2.10. For Voltage Dips and Interruptions Test Item 1.

Equipment Dips Tester

Manufacturer HAEFELY

Model No. Serial No. Last Cal. Cal. Interval Pline1610 083732-12 May 27, 2010 1Year

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 9 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

3. ELECTROSTATIC DISCHARGE IMMUNITY TEST 3.1 Block Diagram of Test Setup Block Diagram of the EUT and the simulators Adapter A

AC Mains

EUT

(EUT: Color Dome Camera ) Block diagram of ESD test setup ESD Tester

EUT AC Mains

0.8 m

AC Mains

(EUT: Color Dome Camera )

3.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003(EN61000-4-2: 2009 Severity Level: 3 / Air Discharge: ±8KV Level: 2 / Contact Discharge: ±4KV)

3.3

Severity Levels and Performance Criterion

Severity level Level 1.

Test Voltage Contact Discharge (KV) ±2

Test Voltage Air Discharge (KV) ±2

2.

±4

±4

3.

±6

±8

4.

±8

±15

X

Special

Special

Performance criterion: B

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 10 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

3.4

EUT Configuration The configuration of EUT is listed in Section 3.3.

3.5

Operating Condition of EUT Same as conducted emission measurement, which is listed in Section 3.4. Except the test set up replaced by Section 7.1.

3.6 Test Procedure Air Discharge: This test is done on a non-conductive surface. The round discharge tip of the discharge electrode shall be approached as fast as possible to touch the EUT. After each discharge, the discharge electrode shall be removed from the EUT. The generator is then re-triggered for a new single discharge and repeated 10 times for each pre-selected test point. This procedure shall be repeated until all the air discharge completed. Contact Discharge: All the procedure shall be same as Section 7.6.1. except that the tip of the discharge electrode shall touch the EUT before the discharge switch is operated. Indirect discharge for horizontal coupling plane At least 10 single discharges (in the most sensitive polarity) shall be applied at the front edge of each HCP opposite the center point of each unit (if applicable) of the EUT and 0.1m from the front of the EUT. The long axis of the discharge electrode shall be in the plane of the HCP and perpendicular to its front edge during the discharge. Indirect discharge for vertical coupling plane At least 10 single discharge (in the most sensitive polarity) shall be applied to the center of one vertical edge of the coupling plane. The coupling plane, of dimensions 0.5m X 0.5m, is placed parallel to, and positioned at a distance of 0.1m from the EUT. Discharges shall be applied to the coupling plane, with this plane in sufficient different positions that the four faces of the EUT are completely illuminated.

3.7 Test Results PASS Please refer to the following page

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 11 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Electrostatic Discharge Test Result SHENZHEN SETEK TECHNOLOGY CO.,LTD Applicant

: Shenzhen LSVT Co., Ltd.

Test Date

: Nov. 29, 2010

EUT

: Color Dome Camera

Temperature

: 22℃

M/N

: YCM-550

Humidity

: 50％

Power Supply

: DC 12V

Test Mode

: Normal

Air discharge

: ±8.0KV

Criterion

: B

Contact discharge: ±6.0KV Location

Test Engineer : Jack Kind A-Air Discharge C-Contact Discharge

Result

Gaps

A

PASS

Metal

C

PASS

HCP

C

PASS

VCP of front

C

PASS

VCP of rear

C

PASS

VCP of left

C

PASS

VCP of right

C

PASS

Test Equipment: ESD Simulator (HAEFELY, PESD1600)

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 12 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

4. RF FIELD STRENGTH SUSCEPTIBILITY TEST 4.1 Block Diagram of Test i.

Block diagram of connection between the EUT and Load Adapter A

AC Mains

EUT

(EUT: Color Dome Camera ) ii.

Block diagram of RS test setup 3 Meters

EUT

Anechoic Chamber

0.8 Meter

Measurement Room Power Amp

Signal Generator

(EUT: Color Dome Camera

)

4.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003(EN61000-4-3: 2006 (Severity Level: 2, 3V / m))

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 13 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

4.3 Severity Levels and Performance Criterion iii.

Severity Levels Level 1.

1

2.

3

3.

10

X iv.

Field Strength V/m

Special

Performance Criterion : A

4.4 EUT Configuration on Test The configuration of the EUT is same as Section 3.3.

4.5 Operating Condition of EUT Same as radiated emission measurement which is listed in Section 3.4, except the test setup replaced as Section 8.1.

4.6 Test Procedure The EUT are placed on a table which is 0.8 meter high above the ground. The EUT is set 3 meters away from the transmitting antenna which is mounted on an antenna tower. Both horizontal and vertical polarization of the antenna are set on test. Each of the four sides of the EUT must be faced this transmitting antenna and measured individually. In order to judge the EUT performance, a CCD camera is used to monitor its screen. All the scanning conditions are as following: Condition of Test Remark -----------------------------------------------------------------------------------1. Fielded Strength 10V/m (Severity Level 3) 2. Radiated Signal Modulated 3. Scanning Frequency 80-2000MHz 4. Sweep time of radiated 0.0015 Decade/s 5. Dwell Time 1 Sec.

Test Results PASS. Please refer to the following page.

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 14 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

RF Field Strength Susceptibility Test Results SHENZHEN SETEK TECHNOLOGY CO., LTD. Applicant

: Shenzhen LSVT Co., Ltd.

Test Date

: Nov. 29, 2010

EUT

: Color Dome Camera

Temperature

: 22℃

M/N

: YCM-550

Humidity

: 50 ％

Field Strength : 10 V/m

Criterion

: A

Power Supply : DC 12V

Test Mode

: Normal

Test Engineer: Jack

Frequency Range : 80 MHz to1000 MHz

Modulation:

Steps

†None Frequency Rang 1: 80~ 2000MHz 1

/

† Pulse ;AM 1KHz Frequency Rang 2: %

Horizontal

Vertical

Front

PASS

PASS

Right

PASS

PASS

Rear

PASS

PASS

Left

PASS

PASS

# Horizontal

/

80%

% Vertical

Test Equipment : 1. Signal Generator : 2031 (MARCONI) 2. Power Amplifier : 500A100 & 100W/1000M1 (A&R) 3. Power Antenna : 3108 (EMCO) & AT1080 (A&R) 4. Field Monitor : FM2000 (A&R)

Note:

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 15 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

5. ELECTRICAL FAST TRANSIENT/BURST IMMUNITY TEST 5.1 Block Diagram of Test Setup Block Diagram of the EUT AC Mains

Adapter A

EUT

(EUT: Color Dome Camera ) EFT Test Setup AC Mains EUT

EFT/B Tester

0.8 m

AC Mains (EUT: Color Dome Camera )

5.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003(EN61000-4-4: 2004+A1:2010 Level 3: 2KV)

5.3 Severity Levels and Performance Criterion Severity level Level 1. 2. 3. 4. X

Open Circuit Output Test Voltage ±10％ On Power Supply On I/O (Input/Output) Lines Signal data and control lines 0.5 KV 0.25 KV 1 KV 0.5 KV 2 KV 1 KV 4 KV 2 KV Special Special

Performance criterion : B

5.4 EUT Configuration The configuration of EUT is listed in Section 3.3.

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 16 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

5.5 Operating Condition of EUT Setup the EUT as shown in Section 9.1. Turn on the power of all equipments. Let the EUT work in test mode (Normal) and measure it.

5.6 Test Procedure The EUT is put on the table which is 0.8 meter high above the ground. This reference ground plane shall project beyond the EUT by at least 0.1m on all sides and the minimum distance between EUT and all other conductive structure, except the ground plane beneath the EUT, shall be more than 0.5m. For input and output AC power ports: The EUT is connected to the power mains by using a coupling device which couples the EFT interference signal to AC power lines. Both polarities of the test voltage should be applied during compliance test and the duration of the test is 2 mins. For signal lines and control lines ports: No I/O ports. It’s unnecessary to test. For DC output line ports: It’s unnecessary to test.

5.7 Test Result PASS Please refer to the following page

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 17 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Electrical Fast Transient/Burst Test Results SHENZHEN SETEK TECHNOLOGY CO., LTD Standard

… IEC 61000-4-4 5 EN 61000-4-4

Result : 5 PASS / … FAIL

Applicant : Shenzhen LSVT Co., Ltd. EUT

:

Color Dome Camera

Input Voltage: Criterion :

M/N :

YCM-550

DC 12V B

Ambient Condition :

20 ℃

50%

RH

Operation Mode : Normal Line :

5 AC Mains

Line :

Coupling : 5 Direct

… Signal line

…DC line

Coupling : … Capacitive

Test Time : 120s Line

Test Voltage

Result(+)

Result(-)

L

2KV

PASS

PASS

N

2KV

PASS

PASS

2KV

PASS

PASS

PE L、N L、PE N、PE L、N、PE Signal line DC line Note: Test Equipment

Burst Tester Model : PEFT 4010

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 18 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

6. SURGE IMMUNITY TEST 6.1 Block Diagram of Test Setup Block Diagram of the EUT Adapter A

AC Mains

EUT

(EUT: Color Dome Camera ) Surge Test Setup AC Mains

Surge Tester

EUT

0.8 m

AC Mains

(EUT: Color Dome Camera )

6.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003(EN61000-4-5: 2006) Severity Level: Line to Line: Level 2, 1.0KV

6.3 Severity Levels and Performance Criterion Severity level Severity Level 1 2 3 4 *

Open-Circuit Test Voltage KV 0.5 1.0 2.0 4.0 Special

Performance criterion : B

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 19 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

6.4 EUT Configuration The configuration of EUT is listed in Section 3.3.

6.5 Operating Condition of EUT Setup the EUT as shown in Section 10.1. Turn on the power of all equipments. Let the EUT work in test mode (Normal) and measure it.

6.6 Test Procedure 1) Set up the EUT and test generator as shown on Section 10.1.2. 2) For line to line coupling mode, provide a 1.0 KV 1.2/50us voltage surge (at open-circuit condition) and 8/20us current surge to EUT selected points. 3) At least 5 positive and 5 negative (polarity) tests with a maximum 1/min repetition rate are conducted during test. 4) Different phase angles are done individually. 5) Record the EUT operating situation during compliance test and decide the EUT immunity criterion for above each test.

6.7 Test Result PASS. Please refer to the following page.

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 20 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Surge Immunity Test Result SHENZHEN SETEK TECHNOLOGY CO., LTD. Applicant : Shenzhen LSVT Co., Ltd. EUT : Color Dome Camera M/N : YCM-550

Test Date : Nov. 25, 2010

Power Supply : DC 12V Test Engineer : Jack

Test Mode : Criterion :

Location

Polarity

L1-L2

+ + + + -

Phase Angle 0o 90o 180o 270o 0o 90o 180o 270o

Temperature : Humidity :

Number of Pulse 5 5 5 5 5 5 5 5

22℃ 50％ Normal B

Pulse Voltage (KV) 1 1 1 1 1 1 1 1

Result PASS PASS PASS PASS PASS PASS PASS PASS

L-PE 90

N-PE

Signal line Remark:

Test Equipment : Surge Tester Psurge4.1

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 21 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

7. INJECTED CURRENTS SUSCEPTIBILITY TEST 7.1 Block Diagram of Test Setup Block Diagram of the EUT Adapter A

AC Mains

EUT

(EUT: Color Dome Camera ) Block Diagram of Test Setup EUT

CDN

AC Mains

0.1 m Ground Reference Support Power Signal Amplifier Generator (EUT: Color Dome Camera )

7.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003 (EN61000-4-6: 2009, Severity Level: Level 3, 10V (rms), (0.15MHz ~ 80MHz)

7.3 Severity Levels and Performance Criterion Severity level Level

Field Strength V

1

1

2

3

3

10

X

Special

Performance criterion: A

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 22 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

7.4 EUT Configuration The configuration of EUT is listed in Section 3.3.

7.5 Operating Condition of EUT Setup the EUT as shown in Section 11.1. Turn on the power of all equipments. Let the EUT work in test mode (Normal) and measure it.

7.6 Test Procedure 1) Set up the EUT, CDN and test generators as shown on Section 11.1.2. 2) Let the EUT work in test mode and measure it. 3) The EUT are placed on an insulating support 0.1m high above a ground reference plane. CDN (coupling and decoupling device) is placed on the ground plane about 0.3m from EUT. Cables between CDN and EUT are as short as possible, and their height above the ground reference plane shall be between 30 and 50 mm (where possible). 4) The disturbance signal described below is injected to EUT through CDN. 5) The EUT operates within its operational mode(s) under intended climatic conditions after power on. 6) The frequency range is swept from 150KHz to80MHz using 3V signal level, and with the disturbance signal 80% amplitude modulated with a 1KHz sine wave. 7) The rate of sweep shall not exceed 1.5*10-3decades/s. Where the frequency is swept incrementally, the step size shall not exceed 1% of the start and thereafter 1% of the preceding frequency value. 8) Recording the EUT operating situation during compliance testing and decide the EUT immunity criterion.

7.7 Test Results PASS. Please refer to the following page.

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 23 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Injected Currents Susceptibility Test Results SHENZHEN SETEK TECHNOLOGY CO., LTD. Applicant : Shenzhen LSVT Co., Ltd.

Test Date: Nov. 25, 2010

EUT :

Color Dome Camera

Temperature : 22℃

M/N :

YCM-550

Humidity

: 58％

Power Supply : DC 12V Test Engineer : Jack Test Mode : Normal Frequency Range (MHz) 0.15 ~ 80

Injected Position AC Mains

Strength (Unmodulated) 10V

Criterion

Strength (Unmodulated)

Criterion

A

Result PASS

Test Mode : Frequency Range (MHz)

Injected Position

Remark : 1. Modulation Signal:1KHz 80% AM Measurement Equipment : Simulator: CWS 500 (SWITZERLAND EMTEST) CDN : 5CDN-M2 (SWITZERLAND EMTEST) …CDN-M3 (SWITZERLAND EMTEST) … EM CLAMP(LÜTHI)

Result

Note:

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 24 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

8. VOLTAGE DIPS AND INTERRUPTIONS TEST 8.1 Block Diagram of Test Setup Block Diagram of the EUT Adapter A

AC Mains

EUT

(EUT: Color Dome Camera ) Dips Test Setup AC Mains

EUT

Dips Tester

0.8 m

AC Mains (EUT: Color Dome Camera )

8.2 Test Standard EN 50130-4: 1995+A1: 1998+A2: 2003(EN61000-4-11: 2004)

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 25 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

8.3 Severity Levels and Performance Criterion Severity level Test Level Voltage dip and short %UT interruptions %UT 0

100

40

60

70

30

Duration (in period) 0.5 1 5 10

Performance criterion : B&C

8.4 EUT Configuration The configuration of EUT is listed in Section 3.3.

8.5 Operating Condition of EUT Setup the EUT as shown in Section 13.1. Turn on the power of all equipments. Let the EUT work in test mode (Normal) and measure it.

8.6 Test Procedure 1) Set up the EUT and test generator as shown on Section 13.1.2. 2) The interruptions is introduced at selected phase angles with specified duration. 3) Record any degradation of performance.

8.7 Test Result PASS. Please refer to the following page.

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 26 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

Voltage Dips And Interruptions Test Results Applicant : Shenzhen LSVT Co., Ltd. EUT :

Color Dome Camera

Temperature : 22℃

M/N :

YCM-550

Humidity

: 58％

Power Supply : AC 230V Test Mode : Normal Test Level % UT

Voltage Dips & Duration (in period) Short Interruptions % UT

Criterion

Result

… A 5B 5C …D

70

30

0.5；1；5 and 10P

B

PASS

40

60

0.5；1；5 and 10P

C

PASS

0

100

0.5；1and 5 P

B

PASS

Remark:

UT is the rated voltage for the equipment.

Test Equipment : Dips Tester PLI LP002 1610

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 27 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

APPENDIX I (Photos of EUT)

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 28 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 29 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 30 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 31 of 32

SHENZHEN SETEK TECHNOLOGY CO., LTD. Report No.: ECE1011114R

THE END

The device described above is tested by SHENZHEN SETEK TECHNOLOGY CO., LTD. to determine the maximum emission levels emanating from the device and the severe levels of the device can endure and its performance criterion. This report applies to above tested sample only and shall not be reproduced in part without written approval of SHENZHEN SETEK TECHNOLOGY CO., LTD. Page 32 of 32