John C. Russ Curriculum Vitae Address: 213 Merwin Road, Raleigh, NC 27606-2634, USA Telephone: 919-851-8117; Cell:818-280-6628 e-mail: [email protected], [email protected] Experience Present: Adjunct Professor (retired), Materials Science and Engineering Department, College of Engineering, North Carolina State University. Active as a consultant in Image Analysis, Metallurgy and the Management of Research, Dr. Russ provides international on-site expertise as well as conducting seminars and training programs. 1995-1997: Director of Research, Rank Taylor Hobson, Leicester, England, the leading worldwide supplier of precision metrology instruments (Board-level position). Planned research programs and directed a multidisciplinary team of research professionals responsible for the long range development of methods and instruments for high precision surfaces, including the generation of such surfaces by precision machining and the characterization of form and finish of surfaces with precision metrology tools. Worked with university research departments and obtained British government funding for programs. 1979-present: Research Associate and Visiting Professor, Materials Science and Engineering Department, College of Engineering, North Carolina State University. Also a member of the Biomedical Engineering faculty. Activities included teaching both regular and short courses in image analysis and stereology, upgrading facilities for image analysis, and active collaboration (both within and outside the College of Engineering) on research projects requiring these techniques with funding from public (NSF, DOD, DOE, etc.) and corporate sponsors. Dr. Russ also developed and implemented innovative multimedia teaching methods for undergraduate classes, with major NSF funding. 1974-1979: Senior Vice President, EDAX International (a North American Philips Company), Prairie View, IL. Responsible for applications laboratories, technical marketing of instrumentation, and long range planning, as well as oversight of design and development of hardware and especially software for electron, X-ray and radioisotope-excited X-ray analysis, and related instruments using electron spectroscopy. 1970-1974: Director, EDAX Laboratories, Division of EDAX International, Raleigh, NC. Responsible for applications research on microanalysis and electron microscopy in both biological and physical sciences, and X-ray fluorescence analysis. Also responsible for software development for analytical equipment manufactured by parent company. 1967-1970: Director, Applications Laboratories, JEOL (USA), Medford, MA. Responsible for applications research with scanning and transmission electron microscopes in biological and physical research, and related instrument development, as well as the demonstration of equipment to prospective customers. 1963-1967: Supervisor of Metallography Laboratory in the Research Department, Bethlehem Steel Corp., Bethlehem, PA. Laboratory consisted of light and electron microscopes, electron microprobe and X-ray fluorescence equipment. Primary responsibility was the study of metal microstructure related to development of new alloys. Educational Background: Undergraduate and graduate work in Solid State Physics (Materials Science) at California Institute of Technology (BS 1962, MS 1963), and completion of course work and orals for PhD in Mechanical Engineering at Lehigh University (1967). PhD in Engineering (1989) California Coast University. Also hold AB from Pennsylvania (1957). Professional Societies: Active in the Microscopy Society of America (MSA); Microbeam Analysis Society (MAS); Society of Photo-Optical Instrumentation Engineering (SPIE); International Society for Stereology (ISS); Board member of the Society for Quantitative Morphology (SQM); Fellow of the Royal Microscopical Society (RMS). Dr. Russ participates in meetings of many similar groups at the local and international level; he has served as program chairman for the national EMSA meeting, and was for 9 years a member of organizing committee for the annual Denver X-ray Conference. Dr. Russ has presented invited tutorials at numerous MAS and EMSA meetings, taught workshops at the Denver Conference, and was the traveling guest lecturer in 1984 for the Australian X-ray Analysis Association. He has also been invited to lecture at the National Bureau of Standards and other agencies and national laboratories, and at major meetings such as TMS, AIME, and Inter-Micro. On November 16, 2006, the New York Microscopical Society awarded John Russ the Ernst Abbe Memorial Award for his contributions to the field of microscopy as a developer of computer-assisted microscopy and image analysis. Particular skills and strengths: Intimate and detailed knowledge of image analysis (processing and measurement), of Xray analysis by electron or photon excitation, and of fractal surface geometry and precision surface metrology. Extensive familiarity with related mathematical data reduction methods, and the use of computers for these operations, for simulation, and for instrument control. Broad history of experience with these methods in materials R&D (metals, ceramics and composites), forensic studies (fractography and paint analysis), archaeological studies, and some biological (heavy metal, ionic and tracer localization) and food science applications. Rich experience in presentation of results and tutorials in written and oral form. John Russ is a well-known expert in the fields of image analysis and surface characterization, often called upon to present comprehensive tutorials in these fields. Dr. Russ is frequently asked to review papers for publication and proposals for agency funding. John C. Russ

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Research interests: Dr. Russ' recent work involves the further development of techniques for analysis of images from light, electron and other types of microscopes, particularly methods for acquiring and utilizing two-dimensional images to characterize three-dimensional and surface structures. He continues to develop interactive educational hypermedia in image analysis and materials science. He teaches short courses in Image Analysis at North Carolina State University, the University of Missouri, the Danish Technological Institute, and the McCrone Research Institute as well as conducting specialist courses customized for corporate clients. Other professional activities: John Russ is active as a writer of technical and reference books, computer software and tutorials. He is the Founding Editor-in-Chief of the Journal of Computer Assisted Microscopy, Editor of the series Advances in X-ray Analysis (Plenum Press, NY), Associate Editor of the journal Software for Engineering Students (published by the American Society for Engineering Education), and a member of the editorial board of Microscopy Research and Technique. He has been an instructor for satellite video courses for NTU (National Technological University), short courses for SPIE, and the State University of New York at New Paltz. Dr. Russ was previously on the Board of Directors of Analytical Vision, Inc., a software development company, and Rank Taylor Hobson plc, a precision instrument manufacturer. Consulting: Dr. Russ is often called upon to use his expertise in image and X-ray analysis in consulting situations for such clients as Goodyear, Exxon, UOP, United Technologies, General Electric, 3M, Upjohn, Eli Lilly, Shell Development, Glaxo Wellcome, IBM, Hercules Powder, Canadian National Railways, Monsanto, Rohm & Haas, Zygo, Dow Chemical, Mead Paper, Kodak, Parke Davis, Proctor & Gamble, Coloplast, Clinical Research Associates, Philip Morris, Opal Technologies, the U. S. Dept. of Agriculture, the U. S. Defense Department Mound Laboratories and Los Alamos National Laboratories, and many others. He also has provided testimony as an expert witness in civil and criminal trials. Teaching activities: At N. C. State University, Dr. Russ taught the undergraduate survey materials course (Structure and Properties of Engineering Materials) many times, developed multimedia modules to enhance and extend this course with funding provided in part by NSF, and also revised a course on the use of mathematical tools in materials science. At the graduate level, Dr. Russ has taught courses on X-ray diffraction, crystallography, and electron microscopy, using television lectures as well as traditional classes and laboratory sessions. He introduced two new graduate level courses: one on quantitative X-ray fluorescence microanalysis and a second dealing with image analysis and stereology, which became part of the standard graduate curriculum. The latter was selected for TV distribution through the National Technological University. Dr. Russ has been faculty advisor to Materials undergraduate students, a member of student committees in Materials Science, other College of Engineering Departments, and other Colleges within the University, and chaired both Masters' and Doctoral committees. In 1988, Dr. Russ was nominated for the University's Outstanding Teacher Award. Dr. Russ has organized more than twenty five short courses at NCSU's McKimmon Center for Continuing Education, on topics including electron microscopy, confocal light and acoustic microscopy, tomographic reconstruction, and image analysis and stereology. He continues to offer short courses at the University of Missouri. Personal notes: Past-President of the Raleigh Oratorio Society, and organized their May, 1987, performance in Carnegie Hall, New York City. John Russ served as an unpaid consultant to Hospice of North Carolina and to the Wake County (North Carolina) Public Schools' Academically Gifted program. In the latter role, he has assisted in writing more than 20 funded grant proposals for specific programs. Previously, a Deacon in the Presbyterian Church and Committee Chairman, Boy Scouts of America. Publications: More than 300, including papers, book chapters, and more than 20 reference and textbooks, primarily in the fields of X-ray analysis using energy-dispersive techniques, electron microscopy and microanalysis, image processing and analysis, stereology, surface characterization, and artificial intelligence. Additionally, Dr. Russ has lectured hundreds of times to various groups, worldwide, in the physical and biological sciences, taught short courses in these techniques, etc. Nine patent applications have been filed by previous employers. Several widely used and accepted techniques, such as the use of standardless methods for X-ray microanalysis, windowless energy dispersive spectrometers, feature recognition based on expert systems logic, correcting X-ray line scans and maps for surface geometry, using fractal geometry to characterize texture, and advanced exposure blending methods, plus many more, are based on papers first published by John Russ. Not included in this list of papers are numerous technical notes and several articles, including a book on the subject of microcomputer graphics intended for a general audience, and publication of K-12 educational computer programs (by Verbatim and Hayden Software).

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John C. Russ - Publications 1: J. C. Russ, G. A. Miller The Effect of Oxidation on the Electron Fractographic Interpretation of Fractures in Steel, Proc. 26th Ann. Meeting, Electron Microsc. Society of America, Claitor's Publ., Baton Rouge LA, 1968, 456-457 2: J. C. Russ, A. Kabaya Use of a Non-Dispersive X-ray Spectrometer on the Scanning Electron Microscope, Proc. 2nd Annual SEM Symposium, IITRI, Chicago, 1969, 57-64 3: J. C. Russ, E. McNatt Copper Localization in Cirrhotic Rat Liver by Scanning Electron Microscopy, Proc. 27th Annual Meeting, Electron Microscopy Society of America, Claitor's Publ., Baton Rouge LA, 1969, 38-39 4: J. C. Russ Performance Characteristics of the Non-dispersive X-ray Spectrometer, Proc. 27th Annual Meeting, EMSA, Claitor's Publ., Baton Rouge LA, 1969, 92-93 5: S. Miyauchi, K. Tanaka, J. C. Russ Scanning Electron Beam Instrument for Photo Resist Exposure, Proc. 27th Annual meeting EMSA, Claitor's Publ., Baton Rouge LA, 1969, 150-151 6: M. Watanabe, T. Yanaka, S. Suzuki, M. Fujasawa, Y. Nagakama, J. C. Russ Design of an Electron Microscope for High Resolution and Image Quality, Proc.27th Ann. Mtg. EMSA, Claitor's Publ., Baton Rouge LA, 1969, 178-179 7: E. Elad, A. O. Sandborg, J. C. Russ, T. Van Gorp The use of an Energy Dispersive X-ray Analyzer in Scanning Electron Microscopy, Proc. IEEE Nuclear Science Symposium, San Francisco, 1969 8: J. C. Russ An Introduction to Electron Microscopy, JEOL (USA), Medford, MA, 1969 9: S. Kimoto, J. C. Russ The Characteristics and Applictions of the Scanning Electron Microscope, American Scientist, 57, 1, 1969, 112-133 and Materials Research and Standards 9, 1, 1969, 8-16 10: J. C. Russ Modern Methods for Fracture Analysis, JEOL NEWS, 7M, 2, JEOL, Medford, MA, 1969, 14-28 11: J. C. Russ Die Anwendung des Raster-Elektronenmikroskope in den Werkstoff-wissenschaften, LWU-Schriftenreihe, Heft 2, 1970 12: S. Dorfler, J. C. Russ A System for Stereometric Analysis with the Scanning Electron Microscope, Proc. 3rd Annual SEM Symp., IITRI, Chicago, 1970, 65-72 13: J. C. Russ (ed.) Energy Dispersive X-ray Analysis, STP 485, Amer. Soc. for Test. and Mat'ls, Philadelphia, 1970 14: J. C. Russ Energy Dispersion X-ray Analysis on the Scanning Electron Microscope, in Energy Dispersive X-ray Analysis, (J. C. Russ, ed.), STP 485, American Society for Testing and Materials, Philadelphia, 1970, 154-179 15: J. C. Russ Light Element Analysis using the Semiconductor X-ray Energy Spectrometer, in Energy Dispersive X-ray Analysis, (J. C. Russ, ed.), STP 485, American Society for Testing and Materials, Philadelphia, 1970, 217-231 16: J. C. Russ Rapid Quantitative Bulk Analysis of Brasses using the Energy Dispersive X-ray Analyzer, Proc. 5th Nat'l Conf., EPASA, New York, 1970, 9A-C 17: J. C. Russ Use of Energy Dispersion X-ray Analysis on the Electron Microprobe, Proc. 6th Int'l Symposium on Microtechniques, Graz, Austria, 1970, 221-225 18: J. C. Russ, A. Kabaya Preparation of Samples for Scanning Electron Microscopy, Proc. 28th Ann. EMSA Meeting, Claitor's Publ., Baton Rouge LA, 1970, 380-381 19: A. Kabaya, J. C. Russ Dynamic Observation of Magnetic Fields in the SEM, Proc. 28th Ann. EMSA Meeting,, Claitor's Publ., Baton Rouge LA, 1970, 384-385 20: J. C. Russ Energy Dispersion X-ray Detection in the Scanning Electron Microscope, 7th Intl. Cong. Electron Microscopy, Grenoble, France, 1970, 231-232 21: J. C. Russ Comparison of Fractographic Techniques, Part I, Microstructures, Jan. 1971, 19-22 22: J. C. Russ Comparison of Fractographic Techniques, Part II, Microstructures, Mar. 1971, 13-21 23: J. C. Russ Progress in the Design and Application of Energy Dispersion X-ray Analyzers for the Scanning Electron Microscope, Proc. 4th Ann. SEM Symp., IITRI, Chicago, 1971, 65-72 24: E. L. Thurston, J. C. Russ Scanning and Transmission Electron Microscopy and Microanalysis of Structured Granules in Fischerella Ambigua, Proc. 4th Ann. SEM Symp., IITRI, 1971 25: J. C. Russ Application of Nuclear Diodes 'EDAX' Systems in Geology, Metallurgy and Biology, 4. Kolloquium uber Mikroanalyse sowie mikromorphologische Abbildung von Oberflachen, Bremen, Germany, 1971 26: J. C. Russ Instrumentation- A Short Course on Scanning Electron Microscopy and X-ray Microanalysis, Proc. 6th Natl Conf, EPASA, Pittsburgh, 1971 27: J. C. Russ Spatial Resolution of X-ray Analysis with Solid and Thin Specimens, Proc. 29th Ann. EMSA Meeting, Claitor's Publ, Baton Rouge LA, 1971, 54-55 28: E. L. Thurston, J. C. Russ Scanning Electron Microscopy and Thin Section Microanalysis of Plant Cells, Proc. 29th Ann. EMSA Meeting, Claitor's Publ, Baton Rouge LA, 1971 29: J. C. Russ, M. W. Barnhart The EDIT System for Computer Reduction of Energy Dispersive X-ray Data, 6th Int'l Conf. on X-ray Optics and Microanalysis, Osaka, 1971, 271-278 30: J. C. Russ Elemental X-ray Analysis of Materials, Edax Int'l, Prairie View IL, 1971 31: J. C. Russ Resolution and Sensitivity of X-ray Microanalysis in Biologial Sections by Scanning and Conventional Electron Microscopy, Proc. 5th Ann. SEM Symp., IITRI, Chicago, 1972 32: J. C. Russ Background Subtraction for Energy Dispersive X-ray Spectra, Proc 7th Natl Conf EPASA, 1972, 76A-B 33: J. C. Russ Enhancement of EDX Spectra from TEM and SEM Analysis, Proc. 30th Ann. EMSA Meeting, Claitor's Publ., Baton Rouge LA, 1972 34: J. C. Russ Energy Dispersive Analysis of Biological Thin Sections in the Electron Microscope, Proc. 5th European Cong. of Electron Microscopy, Manchester, England, 1972 John C. Russ

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35: J. C. Russ Deriving the Utmost Information from EDX Spectra, 5. Kolloquium der Arbeitskreise Mikrosonde und Electronenmikroskopische Directabbildung von Oberflachen, Graz, Austria, 1972 36: J. C. Russ Quantitative Results with X-ray Fluorescence Spectrometry using Energy Dispersive Analysis of X-rays, Xray Spectrometry, 1 no.3, 1971, 119 37: J. C. Russ Obtaining Quantitative X-ray Analytical Results from Thin Sections in the Electron Microscope, in Proc. Thin Section Microanalysis Symposium (J.C.Russ, B.J.Panessa, ed.), St. Louis, 1972 38: J. C. Russ Energy Dispersive Analysis of X-rays and the Scanning Electron Microscope, Edax Int'l, Prairie View IL, 1972 39: J. C. Russ Application of EDX Methods to the Microanalysis of Biological Tissue on the Stereoscan, Proc. 5th Annual Stereoscan Colloquium, Chicago, 1972 40: J. C. Russ X-ray Spectroscopy on the Electron Microscope, X-ray Spectrom., 2 no.1, 1973 41: J. C. Russ Microanalysis of Thin Sections, Coatings and Rough Surfaces, Proc. 6th Ann. SEM Symposium, IITRI, Chicago, 1973 42: J. C. Russ, A. O. Sandborg, M. W. Barnhart, C. E. Soderquist, R. W. Lichtinger, C. J. Walsh An Integrated System for Elemental X-ray Analysis of Materials, in Advances in X-ray Analysis, vol 16, Plenum, 1973 43: J. C. Russ Microanalysis of Thin Sections in the TEM and STEM using Energy Dispersive X-ray Analysis, in Electron Microscopy and Cytochemistry (E.Wisse et al, ed.), Proc 2nd Intern'l Symp., Drienerlo, 1973, 233-238 44: J. C. Russ Obtaining Quantitative Information from an SEM Equipped with an Energy Dispersive X-ray Analyzer, Proc. SEM 1973, Conf. Series no. 18, Institute of Physics, London, 238-241 45: J. C. Russ, M. W. Barnhart, J. L. Christopher Element and Compound Distribution Mapping in the SEM, Proc. Ann. EMSA Meeting, Claitor's Publ, Baton Rouge LA, 1973 46: J. C. Russ Quantitative Electron Probe Microanalysis of Particles, Proc 8th Natl Conf EPASA, New Orleans, 1973, 40A 47: J. C. Russ, A. O. Sandborg, M. W. Barnhart Energy Dispersive X-ray Fluorescence Analysis: Use of Multi-element Detection for Rapid On-Line Classification and Sorting, XVII Colloq. Spectroscop. Internat., Florence, 1973 48: J. C. Russ Microanalysis of Thin Sections by Energy Dispersive X-ray Analysis, 4th Congress, European Society of Pathology, Budapest, 1973 49: J. C. Russ, A. O. Sandborg, U. Theis Quantitative Analysis of Metal Foils, Extraction Replicas and Biological Thin Sections in the TEM and STEM, Proc. 6th Coll. Electron Microsc. Surface Analysis, Liege, Belgium, 1973 50: J. C. Russ Evaluation of the Direct Element Ratio Calculation Method, Jour. de Microsc. 22, 2-3, 1973, 283-286 51: J. C. Russ X-ray Microanalysis in the Biological Sciences, Journal of Submicroscopic Cytology, 6 no.1, 1974 52: A. O. Sandborg, J. C. Russ Microanalysis of Biological Sections in the TEM and SEM, in Recent Progress in Electron Microscopy of Cells, 1974 53: J. C. Russ X-ray Methods in the Scanning Electron Microscope, in Scanning Electron Microscopy - Methods and Phenomena (W. R. Bottoms, ed.), Academic Press, 1974 54: J. C. Russ Eliminating Standards for Quantitative Microanalysis, Proc. 7th Intl Conf of X-ray Optics and Microanalysis, Moscow, 1974 55: J. C. Russ, N. C. Barbi Removing Substrate Background in TEM Microanalysis, Proc. Ann. EMSA Conf., Claitor's Publ., Baton Rouge LA, 1974, 568-569 56: J. C. Russ, N. C. Barbi Applications of ED Analysis in the TEM in Pathology and Pollution Studies, Proc. Ann. EMSA Conf., Claitor's Publ., Baton Rouge LA, 1974 57: J. C. Russ Quantitative Microanalysis with Minimum Pure Element Standards, Proc. Ann. EPASA meeting, Ottawa, Canada, 1974 58: J. C. Russ, N. C. Barbi X-ray Microanalysis of Thin Sections: Spatial Resolution and Quantitative Analysis, 8th Int'l Congress on EM, Canberra, Australia, 1974 59: J. C. Russ The Direct Element Ratio Model for Quantitative Analysis of Thin Sections, in Microprobe Analysis as Applied to Cells and Tissues (T.Hall, P.Echlin, R. Kaufman, ed.), Academic Press, London, 1974, 269-276 60: N. C. Barbi, J. C. Russ Analysis of Oxygen on an SEM using a Windowless Energy Dispersive X-ray Spectrometer, Proc. 8th Ann. SEM Symp., St. Louis, 1975 61: B. J. Panessa, J. C. Russ Techniques for Practical Biological Microanalysis, Proc. 8th Ann. SEM Symp., St. Louis, 1975 62: J. C. Russ Erroneous Si Peaks in Energy Dispersive Spectra, Proc. 24th Ann. Denver X-ray Conf., Denver Univ., 1975, 161-165 63: J. C. Russ A Simple Correction for Backscattering from Inclined Samples, Proc. 10th Nat'l Conf., EPASA, Las Vegas, 1975, 7 64: J. C. Russ Energy Dispersive X-ray Analysis for 'On-Line' Industrial Quality Control, Proc 27th Pitts.Conf., 1976 65: J. C. Russ X-ray Microanalysis at High Beam Voltages, Proc. Ann SEM Conf., 1976, 143-150 66: J. C. Russ Errors Introduced in Eliminating or Extrapolating Standards, Proc 7th Annual MAS meeting, 1976, 19 67: J. C. Russ Organic Coating Thickness Measurement Proc. 7th Ann. MAS mtg., 1976, 52 68: J. C. Russ TEM and STEM Microanalysis Proc 34th EMSA Mtg, Claitor's Publ, Baton Rouge LA, 1976, 562 69: J. C. Russ Specimen Charging: Effect on Beam Voltage Proc. 34th Ann. EMSA Meeting, Claitor's Publ, Baton Rouge LA, 1976, 574 70: A. O. Sandborg, J. C. Russ Counting Rate Performance of Energy Dispersive XRF Systems, Proc. Denver X-ray Conf., Denver Univ., 1976, 65 John C. Russ

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71: J. C. Russ Processing of EDX Spectra, Proc. Denver X-ray Conf., Denver Univ., 1976, 81 72: D. T. Carlton, J. C. Russ Trace Level Water Analysis by Energy Dispersive X-ray Fluorescence, X-ray Spectrometry, 5 no.2, 1976, 172-174 73: J. C. Russ, G. C. Baerwaldt, W. R. McMillan Routine Use of a Second Generation Windowless Detector for Energy Dispersive Ultra-Light Element X-ray Analysis, X-ray Spectrometry, 5 no.4, 1976, 212-222 74: R. B. Shen, J. C. Russ A Fundamental Parameters 'No Standards' Method for Quantitative Energy Dispersive X-ray Fluorescence Analysis, Proc. 28th Ann. Pittsburgh Conf, 1977 75: J. C. Russ Procedures for Quantitative Ultralight Element Energy Dispersive X-ray Analysis, Proc. Ann. SEM Symp., 1977, SEM Inc., 289 76: J. C. Russ Selecting Optimum kV for STEM Microanalysis, Proc. Ann. SEM Symp., 1977, SEM Inc., 335 77: J. C. Russ Use of the Electron Backscatter Factor to Normalize X-ray Microanalysis, Proc. 8th Annual MAS meeting, 1977, 34 78: J. C. Russ Getting Accurate Intensity Values from EDX Spectra Using Fixed Energy Windows, Proc. MAS Conf., 1977, 97 79: S. Shulman, J. C. Russ Disk Operating System, Proc. 8th Ann. MAS meeting, 1977, 99 80: J. C. Russ Automatic Fitting of Calculated Backgrounds in Energy Dispersive X-ray Spectra, Proc. 8th Ann. MAS Conf, 1977, 102 81: J. C. Russ Measuring Detector Entrance Windows, Proc. 8th Ann. MAS meeting, 1977, 105 82: A. O. Sandborg, R. W. Lichtinger, J. C. Russ An Energy Dispersive Spectrometer for Elements from 6 to 92, Proc. 8th Ann. MAS meeting, 1977, 107 83: J. C. Russ, A. O. Sandborg Evaluation of Pulse Pileup Rejection, Proc.Denver X-ray Conf., Denver U., 1977, 93 84: J. C. Russ Problems in using Fixed Energy Windows to get Intensity values from Energy Dispersive X-ray Spectra, Proc. Ann. Denver X-ray Conf., 1977, 96 85: R. B. Shen, J. C. Russ Extended Uses for the Multichannel Analyzer Display, Proc, Ann. SAS Mtg, Montreal, Canada, 1977 87: J. C. Russ Resolving Spectrum Interferences using Non-Gaussian Peaks, Canad. Journ. of Spectroscopy, Feb, 1976 88: J. C. Russ Processing of Energy Dispersive X-ray Spectra, X-ray Spectrom., 6, 1977, 37 89: R. B. Shen, J. C. Russ A Simplified Fundamental Parameters Method for Quantitative Energy Dispersive X-ray Fluorescence Analysis, X-ray Spectrometry, 6 no.1, 1977, 56 90: J. C. Russ Analyzing Calcium in the Presence of Antimony, Edax Editor, 7 no.4, 1977, 18 91: J. C. Russ, R. B. Shen, R. Jenkins EXAM - Principles and Experiments, Edax Int'l, Inc., Prairie View IL, 1977 92: R. B. Shen, J. C. Russ Self Optimization of an X-ray Fluorescence System, Proc. 29th Ann. Pitts. Conf., 1978 93: J. C. Russ A Fast, Self Contained No-Standards Quantitative Program for EDS, Proc. 9th Ann. MAS meeting, 1978, 46 94: J. C. Russ Interactive Displays and Simple Algorithms as an Aid to Qualitative Analysis of Energy Dispersive Spectra, Proc. 9th Ann. MAS meeting, 1978, 54 95: J. C. Russ Variation in Intensity Ratios used for Asbestos Fiber Identification, Proc.9th Ann. MAS Mtg, 1978, 58 96: J. C. Russ, R. B. Shen An Efficient Combined ED/WD X-ray Analysis System, Proc.9th MAS Mtg, 1978, 86 97: J. C. Russ Verification of Stability and Precision of Energy Dispersive XRF Systems, Proc. Ann. Denver X-ray Conf., Denver Univ., 1978 98: R. B. Shen, J. C. Russ, A. W. Stroeve Modelling Intensity and Concentration in Energy Dispersive X-ray Fluorescence, Proc. Ann. Denver X-ray Conf., Denver Univ., 1978, 129 99: J. C. Russ Processing X-ray Spectra from Thin Sections for Quantitative Analysis, Intl. Symp. on Microprobe Analysis of Biological Samples, Microscopica Acta, supplement 2, 1978 100: J. C. Russ Electron Probe X-ray Microanalysis- Principles, in Electron Probe Microanalysis in Biology (D. A. Erasmus, ed.), Chapman & Hall, 1978, 5-36 101: J. C. Russ Digitized X-ray Maps, Edax Editor, 8 no.2, 1978, 23 102: R. B. Shen, J. C. Russ Closing the Loop: Letting the XRF System Select its Own Parameters, Edax Editor, 8 no.3, 1978, 20 103: J. C. Russ Analysis of Elemental Ratios in 'Thin' Sections, Proc. SEM Symposium 1979 vol 2 (O. Johari, ed.), SEM Inc, 1979, 673-682 104: R. B. Shen, J. C. Russ NBS COR2 Program Modified for Nova Minicomputer, Edax Editor, 9 no.1, 1979, 14 105: J. C. Russ, R. B. Shen X-ray Mapping, Trace Element Analysis and Qualitative Analysis using WEDAX, Edax Editor, 9 no.1, 1979, 1 106: J. C. Russ X-ray Mapping on Irregular Surfaces, Proc. Ann. EMSA Mtg, Claitor's, 1979 107: J. C. Russ Alloy Sorting with 'MAX', Edax Editor, 9 no.3, 14 108: J. C. Russ, R. B. Shen Sensitivity and Detection Limits for the EXAM 9500, Edax Editor, 9 no.3, 15 109: J. C. Russ Quantitative Analysis of Multiphase Samples, in Microbeam Analysis 1979 (D. E. Newbury, ed.), San Francisco Press, 1979, 259-264 110: J. C. Russ Modifications and Extensions to NBS Frame-C, in Microbeam Analysis 1979 (D. E. Newbury, ed.), San Francisco Press, 1979, 268-272 111: J. C. Russ New Methods to Obtain and Present SEM X-ray Line Scans, in Microbeam Analysis 1979 (D. E. Newbury, ed.), San Francisco Press, 1979, 292-304 John C. Russ

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112: R. B. Shen, J. W. Criss, J. C. Russ, A. O. Sandborg Modified NRL-XRF Program for Energy Dispersive X-ray Fluorescence Analysis, Edax Editor, 9 no.4, 1979, 1 113: J. C. Russ Standardization Techniques for Quantitative Biological Microanalysis, in Proc. SEM Symp. 1980, vol.4 (O. Johari, ed.), SEM Inc., 1980, 139-146 114: J. C. Russ Variation in X-ray Intensity Ratios used to Identify Asbestos Fibers, in Characterization of Particles (K. F. J. Heinrich, ed.), NBS Special Pub. 533, 1980, 13-20 115: J. C. Russ, W. C. Rich User Programming for the PV9100 Analyzer, Edax Editor, 10 no.1, 1980, 5 116: J. C. Russ, f(rz) Curves, Edax Editor, 10 no.1, 1980, 11 117: R. Auermann, J. C. Russ, R. B. Shen Routine Energy Dispersive Analysis of Sulfur in Coal, in Advances in X-ray Analysis vol. 23 (J. R. Rhodes et al, ed.), Plenum, New York, 1980, 65-70 118: J. C. Russ Energy Dispersive X-ray Fluorescence Analysis of Inks on Paper, in Advances in X-ray Analysis vol.23 (J. R. Rhodes et al, ed.), Plenum, New York, 1980, 219-222 119: J. C. Russ, T. M. Hare Quantitative X-ray Microanalysis on Surfaces with Unknown Orientation, in Microbeam Analysis 1980 (D. B. Wittry, ed.) San Francisco Press, 1980, 62-64 120: J. C. Russ, T. M. Hare, A. G. Solomah Selective X-ray Analysis of Individual Fine Grains for Phase Identification in SEM, Canadian Journal of Spectroscopy, 25, 1980, 64-69 121: H. Palmour III, J. C. Russ, T. M. Hare Research Studies related to impact-produced distribution of fracture fragments from simulated radwaste forms, Final tech. rept, Argonne Nat'l Labs, Contr 31-109-38-5843, Sept. 1988 122: J. C. Russ, T. M. Hare, F. U. Luehrs A Novel, Efficient Alloy Sorting Algorithm, Proc. Ann. Denver X-ray Conf., Denver Univ., 1980, 130-131 123: J. C. Russ, T. M. Hare Quantitative X-ray Microanalysis on Surface with Unknown Orientation, Canadian Journal of Spectroscopy, 25 no.4, 1980, 98-105 124: J. C. Russ, A. O. Sandborg Use of Windowless Detectors for Energy Dispersive Light Element X-ray Analysis, in Energy Dispersive X-ray Spectrometry (K. F. J. Heinrich, ed.), NBS Special Publication 604, 1981, 71-96 125: J. C. Russ Multiple Least Squares Fitting for Spectrum Deconvolution, in Energy Dispersive X-ray Spectrometry (K. F. J. Heinrich, ed.), NBS Special Publication 604, 1981, 297-314 126: J. C. Russ, R. Carey, V. K. Chopra Line Scan and X-ray Map Enhancement of SEM X-ray Data, U.S. Patent # 4,253,153 Feb. 24, 1981 127: J. C. Russ, R. Carey, V. K. Chopra Dynamically variable scaling method and apparatus for spectral displays, US Patent 4,236,151, April 17, 1978 128: J. C. Russ, T. M. Hare Characterization of Heterogeneous Polycrystalline Materials, in Microbeam Analysis 1981 (R. H. Geiss, ed.), San Francisco Press, 1981, 186-189 129: H. Palmour III, T. M. Hare, J. C. Russ, C. B. Boss, A. G. Solomah, A. D. Batchelor Subsolidus sintering of SYNROC: Materials selections, process improvement, waste form evaluations, Topical report NCSU-81-3, Contract DEAC09-81-SR-10957, July 1981 130: J. C. Russ, C. S. Barrett, P. K. Predecki, D. E. Leyden (editors) Advances in X-ray Analysis vol 25, Plenum Press, New York, 1982 131: J. C. Russ, T. M. Hare, M. J. Lanzo X-ray Diffraction Phase Analysis using Microcomputers, in Advances in X-ray Analysis vol. 25 (J. C. Russ et. al., ed.) Plenum Press, New York, 1982 132: D. Hale, T. Satterfield, D. Blankenship, J. C. Russ A Modular ADC/Microcomputer System for Energy Dispersive Xray Spectrometry, in Advances in X-ray Analysis vol. 25 (J. C. Russ et. al., ed.) Plenum Press, New York, 1982 133: D. Hale, J. C. Russ, D. E. Leyden Operation of a Microcomputer-based Multichannel Analyzer with Energy Dispersive Detectors, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 473-478 134: J. C. Russ Processing X-ray Spectra, Data and Line Scans in a 'Personal' Computer, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 479-486 135: W. D. Stewart, J. C. Russ Running Wavelength Dispersive X-ray Spectrometers with a Microcomputer, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 487-490 136: E. M. Gregory, T. M. Hare, J. C. Russ Controlling a Scanning Electron Microscope with a Dedicated Microcomputer, in Microbeam Analysis 1982, (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 499-503 137: T. M. Hare, D. Batchellor, J. C. Russ Multipoint X-ray Analysis using the Backscattered Electron Signal as a Guide, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 491-494 138: J. C. Russ, M. Huns Image Acquisition for Feature Detection with Graphics Tablet and Video Input, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 504-508 139: T. M. Hare, J. C. Russ, J. Ch. Russ Image Measuring Algorithms for a Small Computer, in Microbeam Analysis 1982 (K. F. J. Heinrich, ed.), San Francisco Press, 1982, 509-516 140: H. Palmour III, T. M. Hare, J. C. Russ, A. D. Batchelor, M. J. Paisley, L. E. Freed, Support for DOE programs in mineral waste form development, Final Tech.Rep't,UCRL Subc.6548901, Lawrence Livermore Labs, Sept., 1982 141: J. C. Russ, T. M. Hare An Automated X-ray Diffractometer for Detection and Identification of Minor Phases in Advances in X-Ray Analysis, vol.26, (C.R.Hubbard et.al., ed.), Plenum Press, New York, 1983 142: J. C. Russ, Fundamentals of Energy Dispersive X-ray Analysis, Butterworth Scientific Publishers, London, 1984 143: J. C. Russ, T. M. Hare, W. D. Stewart Automation of an X-Ray Powder Diffractometer using Microcomputer Control, Proc. Annual Australian Conf. on X-ray Analysis, Melbourne, 1983 John C. Russ

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144: J. C. Russ, T. M. Hare A Self-Educating Classification Scheme for Particle and Phase Identification, in Microbeam Analysis 1983, (R. Gooley, ed.), San Fran. Press, 1983, 111-114 145: J. C. Russ Analysis of Elemental Ratios in 'Thin' Samples, in Basic Methods in Biological X-ray Microanalysis, (G.M.Roomans, J.D.Shelbourne, ed.), SEM Inc., Chicago, 1983, 261-270 146: J. B. Cohen, J. C. Russ, D. E. Leyden, C. S. Barrett, P. K. Predecki (editors) Advances in X-ray Analysis, vol. 27, Plenum Press, New York, 1984 147: J. C. Russ, J. Ch. Russ, D. E. Leyden Using a Microcomputer - controlled Robot Arm as a General Purpose Sample Changer, in Advances in X-ray Analysis, vol. 27 (J. B. Cohen, et.al, ed.), Plenum Press, New York, 1984 148: J. C. Russ, W. D. Stewart Quantitative Image Measurement Using a Microcomputer System, American Laboratory, 15, No. 12, Dec. 1983, 70-75 149: J. C. Russ, J. Ch. RussImage Processing in a General Purpose Microcomputer, J. Microscopy, 135, Pt. 1, July 1984, 89-102 150: J. C. Russ et. al. (editors) Advances in X-ray Analysis vol. 28, Plenum Press, New York, 1985 151: J. C. Russ XRF and other Surface Analysis Techniques, in Advances in X-ray Analysis, vol. 28 (J. C. Russ et.al., ed.), Plenum Press, New York, 1984 152: J. C. Russ Qualitative Analysis of X-ray Spectra, in Advances in X-ray Analysis vol. 28 (J. C. Russ et.al., ed.), Plenum Press, New York, 1984 153: J. Ch. Russ, J. C. Russ Enhancement and Combination of X-ray Maps and Electron Images, in Microbeam Analysis 1984 (A. D. Romig, J. I. Goldstein, ed.), San Fran.Press, 1984, 161-164 154: J-F Tian, J. C. Russ Surface Tilt Effects on the Effective Current Factor, in Microbeam Analysis 1984(A. D. Romig, J. I. Goldstein, ed.), San Francisco Press, 1984, 186-189 155: I. Simonsen, T. M. Hare, J. C. Russ Effect of Scale on Intensities from Heterogeneous Aluminum Bronzes, in Microbeam Analysis 1984 (A. D. Romig, J. I. Goldstein, ed.), San Francisco Press, 1984, 306-308 156: J.-M. Luginbuhl, K. R. Pond, J. C. Russ, E. A. Tolley Use of microcomputer in feedstuff particle size evaluation: a direct approach, in Techniques in Particle Size Analysis of Feed and Digesta in Ruminants (P. M. Kennedy, ed.) Canadian Soc. Anim. Sci. Occasional Publ. No. 1, Edmonton, Alberta, Canada, 1984, pp. 57-61 157: J. C. Russ Implementing a new skeletonizing algorithm, Journal of Microscopy, 136, pt.3, Dec. 1984, RP7-8 158: J. C. Russ, W. D. Stewart, J. Ch. RussDensitometric Image Measurements, American Lab, 17, no.4, 1985, 41-50 159: J. C. Russ, T. M. Hare Measurement of edge-intersecting features in SEM images, Microbeam Analysis 1985 (J. T. Armstrong, ed.), San Francisco Press, 133-136 160: W. D. Stewart, J. Ch. Russ, J. C. Russ A passive SEM-microcomputer interface for acquisition of electron images and X-ray maps, Microbeam Analysis 1985 (J. T. Armstrong, ed.), San Francisco Press, 141-144 (reprinted in Test and Measurement World, March 1986) 161: C. S. Barrett, J. B. Cohen, J. Faber, Jr., R. Jenkins, D. E. Leyden, J. C. Russ, P. K. Predecki (ed.) Advances in X-ray Analysis, Vol. 29, Plenum Press, New York, 1986 162: J. C. Russ, T. M. Hare, R. P. Christensen, T. K. Hare, J. Ch. RussSEM low magnification stereoscopic technique for mapping surface contours - application to measurement of volume differences in human teeth due to polishing, J. Microscopy, 144 Dec. 1986, 329 163: J. Ch. Russ, J. C. Russ Image processing for the location and isolation of features, Microbeam Analysis 1986 (A. D. Romig, W. F. Chambers, ed.) San Francisco Press, 1986, 501-504 164: J. Ch. Russ, J. C. Russ Automatic editing of binary images for feature isolation and measurement, Microbeam Analysis 1986 (A. D. Romig, W. F. Chambers, ed.) San Francisco Press, 1986, 505-508 165: J. C. Russ, J. Ch. RussShape and surface roughness characterization for particles and surfaces viewed in the SEM, Microbeam Analysis 1986 (A. D. Romig, W. F. Chambers, ed.) San Francisco Press, 1986, 509-512 166: J. C. Russ, T. M. Hare Size models for real particles viewed in projected images, Microbeam Analysis 1986 (A. D. Romig, W. F. Chambers, ed.) San Francisco Press, 1986, 513-516 167: J. C. Russ, T. M. Hare Serial sections and stereoscopy - complementary approaches to three-dimensional reconstruction, EMSA Proceedings, San Francisco Press, 1986, p.36-37 168: C. S. Barrett. J. V. Gilfrich, R. Jenkins, D. E. Leyden, J. C. Russ, P. K. Predecki (ed.) Advances in X-ray Analysis, Vol. 30, Plenum Press, New York, 1987 169: P. Sujjayakorn, H. H. Stadelmaier, J. C. Russ Computing X-ray Powder Diffraction Intensities and Bragg Angles Using a Microcomputer, Advances in X-ray Analysis vol. 30 (C. S. Barrett et. al., ed.) Plenum Press, NY, 439-436 170: J. C. Russ Practical Stereology, Plenum Press, New York, 1986 171: J. C. Russ, J. Ch. RussFeature-specific measurement of surface roughness in SEM Images Particle Characterization 4 (1987), 22-25 172: J-M. Luginbuhl, K. R. Pond, J. C. Russ, J. C. Burns Direct evaluation of particles in masticated forage, J. Anim. Sci 61(Suppl 1), (1985) p. 349 173: J-M. Luginbuhl, K. R. Pond, J. C. Russ, J. C. Burns Electronic Monitoring and Interpretation of Mastication Behavior Proc. Comparative Aspects of Physiology of Digestion in Ruminants, Cornell Univ., July 1986, p. 2-3 174: J-M. Luginbuhl, K. R. Pond, J. C. Russ, J. C. Burns A Computerized recording and processing system to monitor chewing behavior J. Anim. Sci. 64 (Suppl 1), 1986, p. 70 175: J. C. Russ Fractals in Encyclopedia of Materials Science and Engineering, First Supplement (R. W. Cahn, ed.) Pergamon Press, 1993, 169-175 John C. Russ

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176: J. C. Russ Image Analysis in Stereology in Encyclopedia of Materials Science and Engineering, First Supplement (R. W. Cahn, ed.) Pergamon Press, 1993,498-504 177: J. C. Russ Quantitative X-ray Microanalysis in Encyclopedia of Materials Science and Engineering, First Supplement (R. W. Cahn, ed.) Pergamon Press, 1993, 593-596 178: T. M. Hare, J. C. Russ, J. E. Lane Volume determination of TEM specimens containing particles or precipitates Journal of Electron Microscopy Technique 10#1, 1988, 1-6 179: J. C. Russ, W. D. Stewart, J. Ch. RussThe Measurement of Macroscopic Images J.Food Tech.42(2) 1988, 94-102 180: J. Ch. Russ, J. C. Russ Improved implementation of a convex segmentation algorithm Acta Ster.7#1 1988, 33-40 181: J. C. Russ, J. Ch. RussAutomatic discrimination of features in grey-scale images J. Microsc 148, 1987, 263-277 182: J. Ch. Russ, J. C. Russ Teaching computers to see, Microbeam Analysis 1987 (R. H. Geiss, ed.) San Francisco Press, p.277-286 183: J. C. Russ, I. Rovner Stereological verification of Zea phytolith taxonomy Phytolitharien News, 4#3 1987, 10-18 184: J. C. Russ, I. Rovner Stereological identification of opal phytolith populations from wild and cultivated Zea American Antiquity 54(4), 1989 784-792 185: J-M. Luginbuhl, K. R. Pond, J. C. Burns, J. C. Russ Particle dimensions and size distribution from masticated Coastal bermudagrass fed to steers at four feeding levels Proc. Ann. Meeting Amer. Soc. Animal Science, Utah State Univ., July, 1987; J. Anim. Sci. 65 (Suppl) p. 344 186: J. C. Russ Automatic methods for the measurement of curvature of lines, features and feature alignment in images J. Computer Assisted Microscopy 1 (1989) p. 39-78 187: J. C. Russ Computer Assisted Microscopy - The Analysis and Measurement of Images (videotaped lecture series and textbook) Engineering Extension Service, North Carolina State University, Raleigh NC, 1988 188: C. S. Barrett, J. V. Gilfrich, R. Jenkins, J. C. Russ, J. W. Richardson, P. K. Predecki (ed.) Advances in X-ray Analysis vol. 31, Plenum Press, New York, 1988 189: J. C. Russ X-ray Imaging of Surface and Internal Structure, in Advances in X-ray Analysis vol. 31, Plenum Press, New York (1988) p. 25-34 190: J. C. Russ Computers in Stereology and Image Analysis, Microbeam Analysis 1988 (D. E. Newbury, ed.) San Francisco Press, p. 14-17 191: Z. Radzimski, T. Humphreys, J. C. Russ Revealing depth information by processing EBIC images Proc. Electr. Microsc. Soc. Amer., San Francisco Press, 1988, p. 850-851 192: C. S. Barrett, J. V. Gilfrich, R. Jenkins, J. C. Russ, J. W. Richardson, P. K. Predecki (ed.) Advances in X-ray Analysis, Vol. 32, Plenum Press, New York, 1989 193: J. C. Russ, T. Taguchi, P. M. Peters, E. Chatfield, J. Ch. Russ, W. D. Stewart Automatic measurement of SAED patterns from asbestos materials Proc. Electr. Microsc. Soc. Amer., San Francisco Press, 1988, p. 846-847 194: G. P. Stewart, D. E. Savoca. J. C. Russ SEM Measurement of Surface Roughness of Dental Filling Materials Proc. Electr. Microsc. Soc. Amer., San Francisco Press, 1988, p. 752-753 195: J-M. Luginbuhl, K. R. Pond, J. C. Russ, J. C. Burns A Simple Electronic Device and Computer Interface System for Monitoring Chewing Behavior of Stall-Fed Ruminant Animals J. Dairy Sci. 70 (1987) p. 1307-1312 196: J. C. Russ Techniques for measuring boundary and feature curvature with a computer-based image analyzer Proc. 2nd Conference on Microstructology, Birmingham AL, 1988 197: J. C. Russ, D. S. Bright, J. Ch. Russ, T. M. Hare Application of the Hough transform to electron diffraction patterns J. of Computer Assisted Microscopy 1 (1989) p. 3-38 198: J-M. Luginbuhl, K. R. Pond, J. C. Burns, J. C. Russ Ingestive mastication of Coastal bermudagrass hay by cattle, ANS Report No. 244, North Carolina Agricultural Research Service, Raleigh, NC (1989) 199: J-M. Luginbuhl, K. R. Pond, J. C. Burns, J. C. Russ Effects of feeding level on eating and ruminating behavior in steers fed Coastal bermudagrass hay J. Anim. Sci. 66, Suppl. 1 (1988) p.339 200: J-M. Luginbuhl, K. R. Pond, J. C. Russ, J. C. Burns The use of computer technology to study chewing behavior, North Carolina State University 1987 ANS Report No. 242 201: J. C. Russ, T. Taguchi, P. M. Peters, E. Chatfield, J. Ch. Russ, W. D. Stewart Automatic computer measurement of selected area electron diffraction patterns from asbestos minerals in Advances in X-Ray Analysis vol. 32 (C. S. Barrett et. al., ed.), Plenum Press, New York, 1989 , p. 593-600 202: W. K. Istone, J. C. Russ, W. Stewart Comparison of Instrumental Techniques to Improve Peak to Background Ratios in X-ray Powder Diffractometry in Advances in X-Ray Analysis vol. 32 (C. S. Barrett et. al., ed.), Plenum Press, New York 1989 p. 601-609 203: P. K. Bhattacharya, S. K. Jones, A. Reisman, J. C. Russ A Study of Electron Damage Effects During Low Voltage SEM Metrology, Proc. SPIE 1087, 9 (1989) 204: J. C. Russ, W. D. Stewart, S. Fletcher Image Analysis of Difficult Structures: The Separation of Touching Phase Regions Microstructural Science 17 (P. J. Kenny et al., ed.), Int'l Metall. Soc., p. 23-37 205: J. C. Russ Image Analysis of Materials' Microstructure in Images of Materials (D. B. Williams, A. Gronsky, A. R. Pelton, ed.; (Proc. World Materials Congress, Chicago, 1988) Oxford Univ. Press, 1991 206: J. C. Russ Computerized Object Recognition using Contextual Learning J.Comp.Assist.Microsc 1 1989 105-129 207: J. C. Russ, H. Palmour III, T. M. Hare Direct 3-D Pore Location Measurement in Alumina, J. Microscopy 155 #2 (1989) p. RP1-2 John C. Russ

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208: J. C. Russ Internal and Surface Measurements using the Confocal Scanning Laser Microscope Microbeam Analysis 1989 (P. E. Russell, ed.) San Francisco Press (1989), p.176-179 209: Z. J. Radzimski, J. C. Russ Backscattered electron imaging of subsurface structures Microbeam Analysis 1989 (P. E. Russell, ed.) San Francisco Press (1989), p.410-412 210: J. C. Russ Differential Absorption Three-Dimensional Microtomography Trans.Am.Nucl.Soc.56 Spl. 3 (1988) 14 211: S. Chevacharoenkul, G. McGuire, J. Fulghum, J. C. Russ Measurement of SiO2 Thickness by HREM Proc. Mater. Res. Soc. (Fall 1988), Boston, paper R2.20 212: D. A. Downs, A. El Shiekh, P. Tucker, J. C. Russ Analysis of interference patterns in acoustic photomicrographs Proc. Electron Microscope Society of America 1989, San Francisco Press, p. 370-371 213: J. Ch. Russ, J. C. Russ 3-D Image Analysis of Serial Focal Sections from Confocal Scanning Laser Microscopy Proc. Electr. Microscope Society of Amer. 1989, San Francisco Press, p. 152-153 214: J. H. Lee, J. C. Russ Metrology of Microelectronic Devices by Stereo SEM J.Comp.Assist.Micro 1 1989, 79-90 215: J. C. Russ, I. Rovner Expert Vision Systems in Archaeometry MRS Bulletin XIV No. 3, 40-44 216: J. C. Russ Computer-Aided Quantitative Microscopy Proc. Int'l Metall. Soc. Mtg., Charlotte, 1989 217: D. A. Downs, A. El Shiekh, P. Tucker, J. C. Russ Analysis of interference patterns in scanning acoustic microscope images of composites J. Comput. Assist. Microscopy 1 No. 2 (1989), 193-213 218: J-M. Luginbuhl, K. R. Pond, J. C. Burns, J. C. Russ Eating and Ruminating Behavior of Steers fed Coastal Bermudagrass Hay at Four Levels, J. Animal Science 67, p. 3410 219: J. C. Russ, P. K. Bhattacharya Calculation of electron dose in metrology of devices with buried active layers J. Comput. Assist. Microscopy 1 No. 2 (1989), 159-180 220: J. Ch. Russ, J. C . Russ Range images and Methods for the Efficient Display of Surfaces J.Comp.Assist.Micro 1,3 (1990) 263-290 221: J. C. Russ, J. Ch. Russ Topological Measurements on Skeletonized Three-Dimensional Networks J. Comput. Assist. Microscopy 1 No. 2 (1989), 131-150 222: Z. J. Radzimski, J. C. Russ Energy selection of backscattered electrons for SEM imaging J. Comput. Assist. Microscopy 1 No. 2 (1989), 181-192 223: J. C. Russ, Z. J. Radzimski, A. Buczkowski, L. Maynard Monte-Carlo modelling of electron signals from heterogeneous samples with non-planar surfaces J. Comput. Assist. Microscopy 2 No. 2, (1990) p. 59-90 224: J. C. Russ Computer Assisted Microscopy: The Analysis and Measurement of Images, 1990, Plenum Press, NY 225: J. C. Russ, J. Ch. Russ Adjacency Measurements in Tesselations, J.Comp.Assist.Micro 1, 3 (1989) 217-248 226: J. C. Russ Using RS-170 video images for quantitative analysis, MICON 90: Advances in Video Technology for Microstructural Control, ASTM STP 1094 (G. F. VanderVoort, ed.) American Society for Testing and Materials, Philadelphia, PA, 1990, p. 29-40 227: J. C. Russ Computer-assisted image analysis in quantitative fractography, Journal of Metals, 42 no. 10, Oct. 1990, p. 16-19 228: J. C. Russ Measurement of feature clustering in images, Proc. Electron Microscopy Society of America, 1990, San Francisco Press 229: J. C. Russ Monte-Carlo modelling of secondary electron yield from rough surfaces, Microbeam Analysis 1990, San Francisco Press, 385-386 230: Z. J. Radzimski, A. Buczkowski, J. C. Russ, G. A. Rozgonyi Electron beam induced current study of multilayer structures, Microbeam Analysis 1990, San Francisco Press, 381-384 231: J. Ch. Russ, J. C. Russ Uses of the Euclidean distance map for the measurement of features in images J. Comput. Assist. Microscopy 1 No 4, (1989) 343-376 232: J. C. Russ A simplified approach to harmonic shape analysis J. Comput. Assist. Microscopy 1 No 4, (1989) 377-396 233: S. K. Jones, R. W. Van Asselt, J. C. Russ, B. W. Dudley, G. Johnson, R. W. Wijnaendts, P. Herman Comparison of Linewidth Measurement Methods for Micron and Submicron Application, SPIE Proc. on Integ. Circuit Metrology, Inspection and Process Control IV, vol 1261 (W. H. Arnold, ed.) SPIE, Bellingham WA 234: J-M. Luginbuhl, K. R. Pond, J. C. Burns, J. C. Russ Effects of ingestive mastication on particle dimensions and weight distribution of coastal bermudagrass hay fed to steers at four levels J. Animal Science 67 (1989) 538-546 235: J-M Luginbuhl, J. C. Russ Automatic classification of chewing behavior in stall-fed steers (in preparation) 236: J. C. Russ Surface characterization: Fractal dimensions, Hurst coefficients and Frequency transforms Journal of Computer Assisted Microscopy 2, #3, 1990, p. 161-184 237: D. B. Fowler, W. Riggs, J. C. Russ Image analysis applied to thermal sprayed coatings Proc. National Thermal Spray Conference, Long Beach CA (1990) 238: J. Ch. Russ, J. C. Russ Computer filtering of microscope color images Scientific Computing and Automation, 7 no 1, Oct. 1990, p.33-41 239: J. C. Russ Practical limitations to image sharpening by deconvolution, Journal of Computer Assisted Microscopy 2, #2, (1990) p. 97-104 240: S. Srinivasen, J. C. Russ, R. O. Scattergood Fractal Analysis of Erosion Surfaces, J. Materials Res., 5, no. 11, (1990) p. 2616-2619 241: Y. Fahmy, J. C. Russ, C. Koch Application of Fractal Geometry Measurements to the Evaluation of Fracture Toughness of Brittle Intermetallics J. Materials Res. 6, #9, 1991, p. 1856-1861 John C. Russ

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242: S. Srinivasen, J. C. Russ, R. O. Scattergood Grain size measuremements using point-sampled intercept technique, Scripta Met. et Mat. 243: J. C. Russ, J. Ch. Russ Volumetric display of internal boundaries, Journal of Computer Assisted Microscopy 2, #2, (1990) p. 105-114 244: S. K. Jones, R. W. VanAsselt, J. C. Russ, B. W. Dudley, G. Johnson, R. W. Wijnaendts, P. Herman Comparison of SEM, confocal light microscope and electrical resistance measurements of microelectronic devices, Journal of Computer Assisted Microscopy 2 #4, 1990, 211-222 245: J. C. Russ Measurements in 3D Imagies, Proc. Electron Microscopy Society of America, 1991, San Francisco Press, 408-409 246: J. C. Russ Segmentation of grey scale images based on texture and orientation, Microbeam Analysis 1991, San Francisco Press, 189-192 247: J. C. Russ Direction information from the Sobel operator, Journal of Computer Assisted Microscopy 2 #4, 1990, 239248 248: J. C. Russ Processing images with a local Hurst operator to reveal textural differences Journal of Computer Assisted Microscopy 2 #4, 1990, 249-257 249: J. C. Russ, M. A. Ray Characterizing surface roughness with fractal dimensions, Hurst coefficients and frequency transforms, Proc. 7th International Congress on Stereology, Irvine, CA, 1991 250: J. C. Russ (1992) The Image Processing Handbook, CRC Press, Boca Raton FL 251: J. C. Russ Efficient calculation procedure for Hurst analysis, Journal of Computer Assisted Microscopy 2, #4, (1990) p. 223-232 252: J. C. Russ (1991) Measurement of depletion layer thickness in metal grains, Journal of Computer Assisted Microscopy 3, #1, 7-14 253: J. C. Russ (1991) Multiband thresholding of images, Journal of Computer Assisted Microscopy 3, #2, 77-96 254: J. C. Russ (1991) Measurement of the Fractal Dimension of Surfaces, Journal of Computer Assisted Microscopy 3, #3, 127-144 255: I. Rovner, J. C. Russ (1992) Darwin and design in phytolith systematics: morphometric methods for mitigating redundancy, in Phytolith Systematics: Emerging Issues (G. Rapp, S. C. Mulholland, ed.) Advances in Archaeological and Museum Science Volume 1, Plenum Press, New York NY, 253-276 256: Y. A. Gowayed, J. C. Russ (1991) Geometric Characterization of Textile Composite Preforms Using Image Analysis Techniques, Journal of Computer Assisted Microscopy 3#4: 189-200 257: J. C. Russ (1991) Multifractals and Mixed Fractals, Journal of Computer Assisted Microscopy 3#4: 211-232 258: J. C. Russ (1992). Characterizing and Modeling Fractal Surfaces Journal of Computer Assisted Microscopy 4(1). 73126. 259: J. C. Russ (1993). Effects of Noise and Anisotropy on STM Determination of Fractal Dimensions Journal of Microscopy, 172(3):239-248. 260: J. C. Russ (1993) A flexible strategy for microscope stage control, Journal of Computer Assisted Microscopy, 5#2, 159-164 261: J. C. Russ (1993) Light Scattering from Fractal Surfaces, Journal of Computer Assisted Microscopy, 5#2, 171-190 262: J. C. Russ (1993) Fractal Surfaces, Plenum Press, New York 263: J. C. Russ (1993) JPEG Image Compression and Image Analysis Journal of Computer Assisted Microscopy, 5#3:237244 264: H. M. Adams, J. C. Russ (1992). Chaos in the Classroom: Exposing Gifted Elementary Children to Chaos and Fractals Journal of Science Education and Technology 1(3): 191-209. 265: J. C. Russ (1992) Image Processing to Correct Defects in Microscope Images Journal of Computer Assisted Microscopy, 4#2, 141-150 266: J. C. Russ (1993) Method and application for ANDing features in binary images Journal of Computer Assisted Microscopy, #5(4):265-272 267: J. R. Tyner, R. O. Scattergood, T. A. Dow, J. C. Russ (1992) Effect of Tool Wear on Surface Finish, Texture and Tool Forces Proc. ASPE Conf., Seattle WA (Nov 8 92) 268: J. C. Russ (1994) Image storage - Part 1: Media, Microscopy Today 269: Z. J. Radzimski, J. C. Russ (1994) BSE Image Simulations of 3D Structures: Effect of electron beam and detector characteristics, Scanning (in press) 270: J. C. Russ (1994) Random vs. Structured Sampling Efficiency Acta Stereologica 271: J. C. Russ (1994) The Image Processing Handbook, 2nd Edition, CRC Press, Boca Raton FL 272: J. C. Russ (1994) Visualizations in Materials Science PWS Kent, Boston (CD-ROM) 273: J. C. Russ (1994) Theorist Notebooks for Askeland 3rd Edition, PWS Kent, Boston (computer program) 274: T. H. Prettyman, R. P. Gardner, J. C. Russ, K. Verghese (1993) Evaluation of a combined transmission and scattering approach to composition imaging of industrial samples in Advances in X-ray Analysis Vol 35 (C. S. Barrett, ed.), Plenum Press, NY, 1235-1241 275: J. C. Russ (1995) Median Filtering in Color Space J Comp. Ass. Microsc. 7(2), 83-90 276: J. C. Russ (1995) Quicktime as a basis for time sequence imaging J Comp. Ass. Microsc. 7(2), 113-125 277: W. G. Babcock, H. West, J. C. Russ (1995) Measurement of Composite Honeycomb Core Structures J Comp. Ass. Microsc. 7(1), 1-16 John C. Russ

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278: U. Skands, J. C. Russ (1995) Fractal surface measurement of isotropically etched glass surfaces J Comp. Ass. Microsc. 7(3), 101-112 279: J. C. Russ (1995) Improvements in Watershed Segmentation with a Smoothed Euclidean Distance Map J Comp. Ass. Microsc. 7(1), 17-34 280: J. C. Russ (1995) Computer-Assisted Manual Stereology J Comp. Ass. Microsc. 7(1), 35-46 281: J. C. Russ (1995) Video Digitizers - a User’s Perspective J Comp. Ass. Microsc. 7(1), 57-66 282: J. C. Russ (1995) Thresholding Images J Comp. Ass. Microsc. 7(3), 141-164 283: J. C. Russ (1995) Designing kernels for image filtering J Comp. Ass. Microsc. 7(4), 179-190 284: U. P. V. Skands, K. Conradson, J. C. Russ (1995) Fractal Surface Investigation using Iterated Functional Systems J Comp. Ass. Microsc. 7(4), 191-210 285: J. C. Russ (1995) Optimal greyscale images J Comp. Ass. Microsc. 7(4), 221-234 286: J. C. Russ (1995) Segmenting touching hollow features J Comp. Ass. Microsc. 7(4), 253-261 287: H. A. Lehr, J. C. Russ, A. M. Gown (1996) Macintosh-based Image Analysis using Photoshop: an inexpensive and accurate method for quantitative immunocytochemistry U.S. & Canadian Academy of Pathology Conference, March 1996. 288: J. C. Russ (1996) Practical Experiences with Multimedia Teaching : a Narrative Journal of Engineering Education 289: J. C. Russ (1996) Teaching Materials Science with Multimedia: a Narrative Materials Research Scciety, Proc. Workshop on Materials Education 290: J. C. Russ (1996) Scanning the Surface, Quality Today April 1996 291: J. C. Russ, P. J. Scott (1996)Quantitative Scanned Probe Microscopy, Proc. Microscope Society of America. 292: J. C. Russ, P. J. Scott (1996)Quantitative Scanned Probe Microscopyof Surfaces, Proc. European Electron Microscopy Society. 293: J. C. Russ, J. Ch. Russ (1996) The Image Processing Toolkit 1.0 (CD-ROM) RGI, Charlotte NC. 294: J. C. Russ (1997) ViMS Guide - manual for Multimedia CD-ROM for Materials Science, PWS Kent, Boston 295: J. C. Russ, R. T. DeHoff (2001) Practical Stereology, 2nd Edition, Plenum Press, NY 296: J. C.Russ, Fractal description of engineering surfaces, 7th Intl Conf on Metrology and Properties of Engineering Surfaces, Chalmers Univ. Goteborg Sweden 297: J. C. Russ, J. Ch. Russ (1997) The Image Processing Toolkit 2.1 (CD-ROM) RGI, Charlotte NC. 298: J. C. Russ (1998) The Image Processing Handbook, 3rd Edition, CRC Press, Boca Raton FL 299: J. C. Russ (1997) An inexpensive test of image quality, J. Computer Assisted Microscopy, 9(4): 191-198 300: J. C. Russ, (1998) Images and human understanding, Proceedings, Australian Conference on Electron Microscopy, Hobart, Australia 301: L.H. Christensen, J. Condeço, P. Wahlberg, B. Christiansen, J.C. Russ, C. Buchardt, L. Borregaard (1998) Surface Microscopy of Injection Molding Tools, Proceedings ICEM-14, 14th International Congress on Electron Microscopy, Cancun, Mexico, 1998 302: J. C. Russ, J. Ch. Russ (1998) The Image Processing Toolkit 2.5 (CD-ROM) RGI, Asheville NC. 303: B. Neal, J. Ch. Russ, J. C. Russ (1998) A superresolution approach to perimeter measurement, J. Computer Assisted Microscopy, 10(1):11-22 304: J. C. Russ, J. Ch. Russ (1998) The Image Processing Toolkit 3.0 (CD-ROM, isbn 1-928808-00-X) RGI, Asheville NC. 305: J. Condeco, L. H. Christensen, S. F. Jorgensen, J. C. Russ, B.-G. Rosen (2000) A comparative study of image stitching algorithms for surface topography measurements, X. Int’l Colloq. on Surfaces, Germany 306: J. Ch. Russ, J. C. Russ (2000) Fovea Pro (CD-ROM, isbn 1-928808-08-5), RGI, Gainesville, FL. 307: J. C. Russ (2000) Characterization of Surface Roughness, Microscopy and Microanalysis 6(suppl 2): 916-917 308: J. C. Russ, J. Ch. Russ (2000) Stereo pair displays of surface range images, Journal of Microscopy 199(2):87-89 309: J. C. Russ (2000) Microscopy, Microstructure and Image Analysis, Proc. International Hydrocolloids Conf. (available online at ) 310: J. Ch. Russ, J. C. Russ (2001) Fovea Pro 2.0 (CD-ROM, isbn 1-928808-16-6), Reindeer Graphics, Asheville NC. 311: J. C. Russ, J. Ch. Russ (2001) The Image Processing Toolkit 4.0 (CD-ROM, isbn 1-928808-26-3) Reindeer Graphics, Asheville NC. 312: J. C. Russ (2001) Fractals in Engineering Metrology, in Metrology & Properties of Engineering Surfaces, E Mainsah, K J Stout and J A Greenwood, ed., Chapman and Hall, London 313: J. C. Russ (2001) Forensic Uses of Digital Imaging, CRC Press, Boca Raton FL 314: J. P. Hornak, J. C. Russ, et. al., editors (2002) Encyclopedia of Imaging Science and Technology, Wiley, New York 315: J. C. Russ (2002) articles: Image Processing Techniques; Image Thresholding and Segmentation; Feature Measurement, in Encyclopedia of Imaging Science and Technology, Wiley, New York 316: J. C. Russ (2002) articles: Fractal Analysis; Stereology, in Encyclopedia of Materials Science and Technology, (K Buschow et al., ed.) Elsevier, Amsterdam 317: J. C. Russ (2002) Recent Developments in Feature Measurement, MicroToday, vol. 01-8:14-18 318: J. C. Russ (2002) The Image Processing Handbook, 4th edition, CRC Press, Boca Raton FL 319: J. C. Russ (2003) Photoshop for Digital Photographers, Reindeer Graphics, Asheville, NC 320: J. C. Russ (2003) The Image Processing Cookbook (for Fovea Pro 3.0), Reindeer Graphics, Asheville, NC 321: J. Ch. Russ, J. C. Russ, B. Neal (2003) Fovea Pro 3.0 (CD-ROM, isbn 1-928808-16-6), Reindeer Graphics, Asheville NC. John C. Russ

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322: J. C. Russ (2003) The Role of Digital Imaging in Document Examination, Journal of the National Association of Document Examiners 323: J. Tiley, T. Searles, E. Lee, S. Kar, R. Banerjee, J. C. Russ, H. L. Fraser (2003) Quantification of Microstructural Features in α/β Titanium Alloys, MSE, in press 324: J. C. Russ (2004) Image Analysis of Food Microstructure, CRC Press, Boca Raton FL (isbn 0-8493-2241-3) 325: J. C. Russ (2004) Seeing the Scientific Image, Proceedings of the Royal Microscopical Society vol. 39 (published in three parts) 326: J. C. Russ (2004) Characterizing Spatial Distributions and Gradients, Proc. Microscopy Society of America, Cambridge Univ. Press 327: B. Neal, J. C. Russ (2004) Principal Components Analysis of Multispectral Image Data, Microscopy Today 12(5):36 328: J. C. Russ (2005) The Image Processing Cookbook (for Fovea Pro 4.0) Reindeer Graphics, Asheville, NC 329: J. C. Russ, J. Ch. Russ (2005) Assembling Stereo Anaglyph Images with Photoshop, Modern Microscopy (www.modernmicroscopy.com) 330: J. C. Russ (2006) The Image Processing Handbook, 5th edition, CRC Press, Boca Raton, FL 331: J. C. Russ, J. Ch. Russ (2007) Introduction to Image Processing and Analysis, CRC Press, Boca Raton, FL Graduate student advisees Poonthavee Sujjayakorn MS 1985 Program for X-ray Powder Diffraction Intensities and Bragg Angles NCSU MatSci Peter N Blake PhD 1988 Ductile Regime Diamond Turning of Germanium and Silicon NCSU MatSci Ju H Lee MS 1988 Topographical Measurement of Integrated Circuit Pattern using Digital Image Processing NCSU MatSci Mark D Fisher PhD1989 Quantitative Stereological Analysis of a Model Electrorheological Fluid NCSU MatSci Robert M Tidwell PhD 1991 Ductile Regime Machining of Germanium NCSU MatSci Robert D All 1991 PhD Experimental Evidence of a Capillary Flow Mechanism for Fugitive Emissions NCSU Chem E Thomas H Prettyman 1991 PhD Composition and Density Imaging of Industrial Samples by a Combination of Photon Transmission Tomography and Projective Compton Scatterometry NCSU Nuc E Yasser A Gowayed 1992 PhD An Integrated Approach to Mechanical and Geometrical Modeling of Textile Structure NCSU Textiles Brian N Davidson 1992 PhD Structure and Electronic Properties of Amorphous Silicon NCSU MatSci Richard C Chapman 1992 PhD Delineation of P-N Junctions by Scanning Tunneling Microscopy NCSU MatSci & MCNC Tianqing He 1992 PhD Development of Monte Carlo Library Least Squares Approach for Energy Dispersive X-ray Analysis NCSU Nuc E Lars M Karlsson 1993 PhD Stereology in Materials Science: Demonstration of Some Methods DTU Lyngby Zhenqiu Wu 1993 PhD Refractive Index Profile of Polymeric Fibers Characterized by Micro Interferometry NCSU Textiles Carsten K Olsson 1993 PhD Image Processing Methods in Materials Science DTU Lyngby Yusuf Fahmy 1993 PhD The Influence of Interstitial Elements on the Mechanical Behavior of V3Au Intermetallic Compound NCSU MatSci Meltem A Narter 1994 PhD Analysis of Three-dimensional Fiberweb Nonwovens NCSU Textiles John P Soehnlen 1995 MS Rheological and Microstructural Evaluation of a Model Cheese System NCSU Food Science John R Tyner 1995 PhD Effect of Tool Wear on Surface Finish, Texture and Tool Forces in Diamond Turning NCSU MatSci and Mech E Ulrik Skands 1996 PhD Quantitative Methods for the Analysis of Electron Microscope Images NCSU MatSci and DTU Lyngby Bradley Jared 1996 PhD Design and Documentation of a Fast Tool Servomechanism NCSU Mech E Helle Wium 1997 PhD Rheology of UF-Feta Cheese KVL, Univ. Copenhagen and DTI Taastrup Jose A Condeco 2001 PhD Industrial Application of Surface Characterisation Techniques DTI Taastrup

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